Arbeitskreis Modellierung von Systemen und Parameterextraktion
Modeling of Systems and Parameter Extraction Working Group
15th MOS-AK Workshop at ESSDERC/ESSCIRC
September 11, 2017 Leuven
The MOS-AK Compact Modeling Association, a global compact/SPICE modeling and Verilog-A standardization forum, held its 15th consecutive workshop as an integral engineering event at the ESSDERC/ESSCIRC on September 11, 2017 in Leuven (B). The event was coorganized by Jean-Michel Sallese, EPFL and Daniel Tomaszewski ITE (PL); its technical program was coordinated by Larry Nagel, OEC (USA) and Andrei Vladimirescu, UCB (USA); ISEP (FR) representing the International MOS-AK Board of R&D Advisers. Technical MOS-AK program promotion was provided by the Eurotraining and NEEDS of nanoHUB.org
A group of the international academic researchers and modeling engineers attended 13 technical compact modeling presentations covering full development chain form the nanoscaled technologies thru semiconductor devices modeling to advanced IC design support. The MOS-AK speakers have shared their latest perspectives on compact/SPICE modeling and Verilog-A standardization in the dynamically evolving semiconductor industry and academic R&D. The event featured advanced technical presentations covering compact model development, implementation, deployment and standardization covering full engineering R&D chain: TCAD/processing, device modeling, transistor level IC design support. These contributions were delivered by leading academic and industrial experts [1-12]. The presentations are available online for
download at <
http://www.mos-ak.org/leuven_2017/>. Selected best presentation will be recommended for further publication in the
IJHSES.
The ESSDERC Track4 Devices and Circuit Compact Modeling has followed the MOS-AK workshop. The Track4 has been organized for very first time to highlight importance of the international compact/SPICE modeling R&D and foster its Verilog-A standardization. The ESSDERC Conference participants have attended four subsequent modeling sessions: Cross-Domain Compact Modeling [13-15]; Parameter Extraction [16-19]; Modeling of Emerging Devices [20-23]; Traps and Noise [24-28]. All the conference papers are available at
IEEE Xplore and selected best papers will be recommended for further publication in
J-EDS.
- 10th International MOS-AK Workshop in Silicon Valley (US) Dec. 2017
- Spring MOS-AK Workshop in Strasbourg (F) March 2018
- 3rd Sino MOS-AK Workshop in Beijing (CN) June, 2018
- 16th MOS-AK ESSDERC/ESSCIRC Workshop in Dresden (D) Sept, 2018
About MOS-AK Association:
MOS-AK, an international compact modeling association primarily focused in Europe, to enable international compact modeling R&D exchange in the North/Latin Americas, EMEA and Asia/Pacific Regions. The MOS-AK Modeling Working Group plays a central role in developing a common language among foundries, CAD vendors, IC designers and model developers by contributing and promoting different elements of compact/SPICE modeling and its Verilog-A standardization and related CAD/EDA tools for the compact models development, validation/implementation and distribution. For more information please visit: mos-ak.org
REFERENCES:
MOS-AK/Leuven 2017 Workshop; Sept. 11, 2017
[1] ASCENT: Access to Leading European Nanoelectronics Technology
Jim Greer Tyndall (IRL)
[2] Junctionless Nanowire Transistors Performance: Static and Dynamic Modeling
Marcelo Antonio Pavanello Centro Universitario FEI (BR)
[3] Modeling and Analysis of Full-Chip Parasitic Substrate Currents
Renaud Gillon and Wim Schoenmaker ONSEMI (B), MAGWEL (B)
[4] Small- and large-signal RF modeling of silicon-based substrates
Martin Rack and Jean-Pierre Raskin Université catholique de Louvain (B)
[5] Tunnel FET C-V modeling: Impact of TFET C-V characteristics on inverter circuit performance
Chika Tanaka, Tetsufumi Tanamoto, and Masato Koyama, Toshiba (J)
[6] ASCENT Open Access to 14nm PDKs
T. Chiarella, N. Cordero, O. Faynot, Tyndall (IRL)
[7] Modelling of Surface Traps Effect on Semiconductor Nanowires
Ashkhen Yesayan*, Stepan Petrosyan*, Jean-Michel Sallese** *IRa, Armenia, **EPFL (CH)
[8] Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers
D. Flandre, V. Kilchytska, B. Kazemi, C. Gimeno and J.-P. Raskin UC Louvain
[9] IEEE EDS Compact Model Standardization
Benjamin Iniguez URV (SP)
[10] Is it possible to reduce the PDK development cost when demand for data is continuously increasing?
Andrej Rumiantsev MPI Corporation
[11] Optimal measurement parameters for accurate time-domain and spectral analyses of RTN
Léopold Van Brandt*, Valeriya Kilchytska*, Jean-Pierre Raskin*, Bertrand Parvais** and Denis Flandre* *ELEN department, ICTEAM Institute, Université catholique de Louvain **imec
[12] Compact modeling for CMOS technology development and IC design
Daniel Tomaszewski ITE Warszaw (PL)
ESSDERC Trac4: Compact Modeling; Tuesday September 12, 2017 (11:00-12:20)
Cross-Domain Compact Modeling
Chair: Wladek Grabinski - MOS-AK; Cristell Maneux – LIMS;
[13] INVITED: SPICE Modeling in Verilog-a: Successes and Challenges
Colin McAndrew
[14] SPICE Modeling of Light Induced Current in Silicon with 'generalized' Lumped Devices
Chiara Rossi, Pietro Buccella, Camillo Stefanucci, Jean-Michel Sallese
[15] Total Ionizing Dose Effects on Analog Performance of 28 nm Bulk MOSFETs
Chun-Min Zhang, Farzan Jazaeri, Alessandro Pezzotta, Claudio Bruschini, Gulio Borghello, Serena Mattiazzo
ESSDERC Trac4: Compact Modeling; Tuesday September 12, 2017 (14:00-15:20)
Parameter Extraction
Chair: Thierry Poiroux - CEA; Marco Bellini – ABB;
[16] Nanometer CMOS Characterization and Compact Modeling at Deep-Cryogenic Temperatures
Rosario Marco Incandela, Lin Song, Harald Homulle, Fabio Sebastiano, Edoardo Charbon, Andrei Vladimirescu
[17] Cryogenic Characterization of 28 nm Bulk CMOS Technology for Quantum Computing
Arnout Beckers, Farzan Jazaeri, Andrea Ruffino, Claudio Bruschini, Andrea Baschirotto, Christian Enz
[18] A New Method for Junctionless Transistors Parameters Extraction
Renan Trevisoli, Rodrigo Doria, Michelly de Souza, Sylvain Barraud, Marcelo Pavanello
[19] Avalanche Compact Model Featuring SiGe HBTs Characteristics Up to BVCBO
Mathieu Jaoul, Didier Céli, Cristell Maneux, Michael Schröter, Andreas Pawlak
ESSDERC Trac4: Compact Modeling; Tuesday September 12, 2017 (16:40-18:00)
Modeling of Emerging Devices
Chair: Jean-Michel Sallese - EPFL; Daniel Tomaszewski - ITE;
[20] Equivalent Circuit Model for the Electron Transport in 2D Resistive Switching Material Systems
Enrique Miranda, Chengbin Pan, Marco Villena, Na Xiao, Jordi Suñe, Mario Lanza
[21] Analytical Drain Current Model for Schottky-Barrier CNTFETs
Igor Bejenari, Michael Schroter, Martin Claus
[22] A General Circuit Model for Spintronic Devices Under Electric and Magnetic Fields
Meshal Alawein, Hossein Fariborzi
[23] Compact Physical Model of a-IGZO TFTs for Circuit Simulation
Matteo Ghittorelli, Fabrizio Torricelli, Carmine Garripoli, Jan-Laurens van der Steen, Gerwin Gelinck, Sahel Abdinia
ESSDERC Trac4: Compact Modeling; Wednesday September 13, 2017 (14:20-15:40)
Traps and Noise
Chair: Benjamin Iniguez - URV; Sadayuki Yoshitomi - Toshiba;
[24] Modeling of Dynamic Trap Density Increase for Aging Simulation of Any MOSFET Circuits Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti, Nezam Rohbani
[25] Comprehensive Compact Electro-Thermal GaN HEMT Model
Muhammad Alshahed, Mina Dakran, Lars Heuken, Mohammed Alomari, Joachim Burghartz
[27] Trap-Assisted Carrier Transport Through the Multi-Stack Gate Dielectrics of HKMG nMOS Transistors: a Compact Model
Apoorva Ojha, Nihar Ranjan Mohapatra
[28] A New Verilog-a Compact Model of Random Telegraph Noise in Oxide-Based RRAM for Advanced Circuit Design
Francesco Maria Puglisi, Nicolò Zagni, Luca Larcher, Paolo Pavan
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