Sep 17, 2020

Fwd: September 2020 Newsletter: Planet-Scale Processing of Silicates

September 2020 Newsletter: Planet-Scale Processing of Silicates
In the eastern Sierra Nevada mountains, near Mammoth Lakes, California, is a geological phenomenon: a cliffside lined with thousands of 10-20 meter tall pillars of basalt. The organized rock columns are so incongruous with the surrounding high altitude pine forest that they seem supernatural. Shepherds who frequented the area in the 1800's named it the "Devil's Woodpile." Today, it's a popular park called the Devils Postpile National Monument.

To a MEMS engineer, this odd rock cliff bears a striking resemblance to
the columnar grains in thin film PZT or ZnO. What a mind bender to see
familiar shapes from SEM images towering overhead.

Like PZT or ZnO, a special set of environmental conditions created the Devils Postpile. It was not, however, the result of grain growth; instead, the Postpile formed from a pool of lava which then cracked into a network of polygons as it cooled. (More like misprocessed thick photoresist!)
A scale factor of 20 million: PZT with columnar grains (top)
compared to basalt columns (bottom).
On top of the Devils Postpile, one particular area has a smooth surface
which reveals the cross-sections of the polygonal columns, 50-100 cm in width. This most unusual stone patio was formed by the water, pressure, and motion of a passing Ice Age glacier, a massive-scale version of chemical mechanical polishing (CMP). Basalt rock is primarily composed of SiO2 (45-52% by weight) and other metal oxides, such as TiO2, Al2O3 and MgO; all familiar MEMS materials, just in a much larger format.
Ancient CMP: cross-section of basalt columns, polished flat
by a glacier. Note the fine lines that were created by
grit trapped in the moving glacier.
Four kilometers from the Postpile is the stunning 30 meter tall Rainbow 
Falls, etched through two layers of volcanic rock. The top masking layer
of rock is harder than the thick underlayer of softer rhyodacite. Water
pouring over the edge erodes the soft rock at a faster rate, leaving a
re-entrant cliff face and thereby creating a beautiful waterfall.

An idle thought while hiking on a hot summer day: Is geology just a
planet-scale version of MEMS processes?
Please note: AMFitzgerald's business operations are continuing normally despite COVID *and* California wildfires.
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[paper] Low-voltage, Non-volatile, Compound-semiconductor Memory Cell

Room-temperature Operation of Low-voltage, Non-volatile, Compound-semiconductor Memory Cell
Ofogh Tizno, Andrew R. J. Marshall, Natalia Fernández-Delgado, Miriam Herrera, Sergio I. Molina
and Manus Hayne
Scientific Reports volume 9, Article number: 8950 (2019) 
DOI: 10.1038/s41598-019-45370-1

Abstract: Whilst the different forms of conventional (charge-based) memories are well suited to their individual roles in computers and other electronic devices, flaws in their properties mean that intensive research into alternative, or emerging, memories continues. In particular, the goal of simultaneously achieving the contradictory requirements of non-volatility and fast, low-voltage (low-energy) switching has proved challenging. Here, we report an oxide-free, floating-gate memory cell based on III-V semiconductor heterostructures with a junctionless channel and non-destructive read of the stored data. Non-volatile data retention of at least 10000s in combination with switching at ≤2.6 V is achieved by use of the extraordinary 2.1 eV conduction band offsets of InAs/AlSb and a triple-barrier resonant tunnelling structure. The combination of low-voltage operation and small capacitance implies intrinsic switching energy per unit area that is 100 and 1000 times smaller than dynamic random access memory and Flash respectively. The device may thus be considered as a new emerging memory with considerable potential.


FIG: Device structure a) Schematic of the processed device with control gate (CG), source (S) and drain (D) contacts (gold). The red spheres represent stored charge in the floating gate (FG). b) Cross-sectional scanning transmission electron microscopy image showing the high quality of the epitaxial material, the individual layers and their heterointerfaces.

Simulation Methods: The nextnano software package was utilised for mathematically modelling the energy band diagram of the memory device structure reported here, taking into account strain and piezoelectricity. Within this work, a self-consistent Schrödinger solver was used along with the Poisson and drift–diffusion equations to calculate the electron densities at equilibrium and under bias.

Sep 16, 2020

The Industry’s First SoC FPGA Development Kit Based on the #RISC-V Instruction Set Architecture is Now Available | Microchip Technology https://t.co/1CCwP6GR3h #semi https://t.co/TKw7mFqOcC



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Sep 15, 2020

FreePDK15: Process Design kit for 15-nm FinFETs

Development of a Predictive Process Design kit for 15-nm FinFETs: FreePDK15 
Kirti Bhanushali, Chinmay Tembe, and W. Rhett Davis 
arXiv:2009.04600v1 [cs.AR] 9 Sep 2020

Abstract: FinFETs are predicted to advance semiconductor scaling for sub-20nm devices. In order to support their introduction into research and universities it is crucial to develop an open source predictive process design kit. This paper discusses in detail the design process for such a kit for 15nm FinFET devices, called the FreePDK15. The kit consists of a layer stack with thirteen-metal layers based on hierarchical-scaling used in ASIC architecture, Middle-of-Line local interconnect layers and a set of Front-End-of-Line layers. The physical and geometrical properties of these layers are defined and these properties determine the density and parasitics of the design. The design rules are laid down considering additional guidelines for process variability, challenges involved in FinFET fabrication and a unique set of design rules are developed for critical dimensions. Layout extraction including modified rules for determining the geometrical characteristics of FinFET layouts are implemented and discussed to obtain successful Layout Versus Schematic checks for a set of layouts. Moreover, additional parasitic components of a standard FinFET device are analyzed and the parasitic extraction of sample layouts is performed. These extraction results are then compared and assessed against the validation models.
FIG: Middle-of-Line layers used as interconnects

Acknowledgment: The authors would like to thank Paul Franzon at NC State University. The authors would like to thank Mentor Graphics, since this project would not have been possible without their generous gift of supporting funds and Calibre licenses. The authors would also like to thank Tarek Ramadan, Ahmed Hammed Fathy, Omar El-Sewefy, Ahmed El-Kordy, Hend Wagieh and the team at Mentor Graphics for development of the first set of design rules and their constant support.In addition, the authors would like to thank and acknowledge Alexandre Toniolo at Nangate for clarifying the vision of MOL layers. We would also like to thank Cadence designsystems for use of the virtuoso software and Synopsys Inc.for use of Pycell studio. The authors would also like to thanks Vikas Sharma for P-Cells, Vidyanandgouda Patil for design rule fixes and Namrata Sampat for help cleaning up the distribution.

Online Lecture Workshop On Frontiers in Science & Engineering - Opportunities for Graduates (Sept 14-19, 2020)

Respected All

On behalf of the organizing committee of the Science Academies Online Lecture Workshop On Frontiers in Science & Engineering - Opportunities for Graduates (Sept 14-19, 2020),

I am sharing separate Zoom Links for each day. 

You are requested to register yourself for one or more sessions by registering separately.

Kindly forward this email to your friends, students and colleagues from all branches of science and engineering. 
  • Kindly join at least 15 minutes before the session.
  • Letter of attendance for each day will be provided at the end of the session.
September 15, 2020 (Zoom Link: https://zoom.us/webinar/register/WN_JF5EVXqsTBCcHLIuL2e7dA)
  • 04:00 pm – 05:00 pm - The Lead Halide Perovskites: Photoluminescence and Charge Carrier Dynamics - Professor Anunay  Samanta, FASc, FNASc, FNA, Sr. Professor and J.C. Bose National Fellow (DST), School of Chemistry, University of Hyderabad
  • 05:00 pm – 06:00 pm  - Interdisciplinary Education for Science and Innovation - Professor Sourav Pal, FASc, FNASc, FNA, Director, Indian Institute of Science Education & Research, West Bengal  
September 16, 2020  (Zoom Link: https://zoom.us/webinar/register/WN_hbdn7CqUQMqWUeyaW7qJTA)
  • 06:00 pm – 07:00 pm Electronic Cash, Cryptocurrencies and Smart Contracts - Professor Rudrapatna Kallikote Shyamasundar, FASc, FNA, FNASc, FNAE, FIEEE, FTWAS, Distinguished V Professor, Computer Science & Engineering Department, IIT Powai
September 17, 2020  (Zoom Link: https://zoom.us/webinar/register/WN_KG1XHg1gReWXDbW4Asg39w)
  • 06:00 pm – 07:00 pm -  Indian Healthcare, Digital Transformation, and COVID-19 - Dr Anurag Agrawal, FNA, Director, CSIR-Institute of Genomics and Integrative Biology, Mall Road, Delhi University
  • 07:00 pm – 08:00 pm  - Responsibilities and opportunities for academics in the context of current pandemic - Dr. Rakesh K Mishra, FASc, FNASc, FNA, Director, CSIR-Centre for Cellular & Molecular Biology, Hyderabad
September 18, 2020 (Zoom Link: https://zoom.us/webinar/register/WN_Hqv3xXODT8-jkMuZmT3eXg)
  • 06:00 pm – 07:00 pm - Continued fraction expansions of complex numbers - Prof. Shrikrishna Gopalrao Dani, FASc, FNA, FNASc, Distinguished Professor, Centre for Excellence in Basic Sciences, University of Mumbai, Maharashtra  
  • 07:00 pm – 08:00 pm - C.R.Rao and Mahalanobis' Distance - Prof. Probal Chaudhuri, FASc, FNA, FNASc, Theoretical Statistics and Mathematics Unit, Indian Statistical Institute, Kolkata  
September 19, 2020 (Zoom Link: https://zoom.us/webinar/register/WN_xDWQkmHdSl69mfci1yLnLA)
  • 06:00 pm – 07:00 pm  - Future Geosciences and Opportunities - Prof. Ashok Kumar Singhvi, FASc, FNA, FNASc, FTWAS, Honorary Scientist, Atmospheric, Molecular & Optical Physics Divn., PRL, Gujarat
  • 07:00 pm – 08:00 pm  - Glasses and other amorphous solids - Professor  Srikanth Sastry, FASc, FNASc, FNA, Theoretical Sciences Unit, JNCASR, Bangalore, Karnataka

with regards

Dr. Manoj Saxena | à¤¡ॉ मनोज  सक्सेना 
Associate Professor | à¤¸à¤¹ - आचार्य
Department of Electronics | à¤‡à¤²ेक्ट्रॉनिक्स विभाग
Deen Dayal Upadhyaya College | à¤¦ीन दयाल उपाध्याय कॉलेज
University of Delhi | à¤¦िल्ली विश्वविद्यालय
Dwarka Sector-3, New Delhi-110078 | à¤¦्वारका क्षेत्र -३, नई दिल्ली -११००७८
India | भारत

ResearcherID-Thomson Reuters : http://www.researcherid.com/rid/K-3863-2015 

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Sep 14, 2020

[mos-ak] Fwd: ESSCIRC ESSDERC 2020 Virtual Educational Events | IMPORTANT MESSAGE

ESSCIRC ESSDERC 2020 VIRTUAL EDUCATIONALS
LIVE EXECUTIVE SESSIONS: September 14, 15 
ON DEMAND September 7 - October 16

Hello,
You are receiving this message because you registered for the ESSCIRC ESSDERC 2020 Virtual Educational Events.

How is it going so far? 
Feel free to use the Q&A box to send us questions: all questions will be gathered end of the week and will be transmitted to the event organizers prior to the Live events next week.

Take also advantage of the POLLS in the following Educational Events: 

3. WORKSHOP | Non-Volatile Memories: Opportunities and Challenges from Devices to Systems
10. DISSEMINATION WORKSHOP |  Toward sustainable IOT from rare materials to big data
11. DISSEMINATION WORKSHOP | High Density 3D CMOS Mixed-Signal Opportunities
12. MOS-AK WORKSHOP | Compact/SPICE Modeling and its Verilog-A Standardization

Questions and polls will be discussed during the LIVE EXECUTIVE SESSIONS.
How to access the Live Executive Sessions?
Once logged in, you see a small window on the left called "ADDITIONAL RESOURCES": the hyperlink to live session is there and, of course, it will be active only during live sessions 

Last but not least, if you are experiencing some connections problems while using your office PC, check with your IT staff if firewalls prevent you from connecting to the on-line virtual events. 

See you there!
ORGANIZING COMMITTEE
Thomas Ernst (CEA-LETI, FR), General co-chair
Dominique Thomas (STMicroelectronics, FR), General co-chair

François Andrieu (CEA-LETI, FR), ESSDERC TPC Chair
Maud Vinet (CEA-LETI, FR), ESSDERC TPC co-Chair

Andreia Cathelin (STMicrolectronics, FR), ESSCIRC TPC Chair
Sylvain Clerc (STMicrolectronics, FR), ESSCIRC TPC co-Chair

2020 Virtual Educationals Chairs
Sylvain Clerc (STMicrolectronics, FR)
Ionut Radu (SOITEC, FR)

LOCAL EXECUTIVE SECRETARIAT
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2020 IEEE #IEDM To Highlight Innovative Devices for a #Better #Future


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Sep 9, 2020

[paper] Analogue 2D Semiconductor Electronics

Analogue two-dimensional semiconductor electronics
Dmitry K. Polyushkin1, Stefan Wachter1, Lukas Mennel1, Matthias Paur1, Maksym Paliy2, Giuseppe Iannaccone2, Gianluca Fiori2, Daniel Neumaier3,4, Barbara Canto3,4
and Thomas Mueller1
Nat Electron 3, 486–491 (2020)
DOI: 10.1038/s41928-020-0460-6

1Vienna University of Technology, Institute of Photonics, Vienna, Austria. 
2Dipartimento di Ingegneria dell’Informazione, Università di Pisa, Pisa, Italy.
3AMO GmbH, Aachen, Germany. 
4Bergische Universität Wuppertal, Wuppertal, Germany

Abstract: Digital electronics are ubiquitous in the modern world, but analogue electronics also play a crucial role in many devices and applications. Analogue circuits are typically manufactured using silicon as the active material. However, the desire for improved performance, new devices and flexible integration has—as for their digital counterparts—led to research into alternative materials, including the use of two-dimensional (2D) materials. Here, we show that operational amplifiers—a basic building block of analogue electronics—can be created using the 2D semiconductor molybdenum disulfide (MoS2) as the active material. The device is capable of stable operation with good performance, and we demonstrate its use in feedback circuits including inverting amplifiers, integrators, log amplifiers and transimpedance amplifiers. We also show that our 2D platform can be used to monolithically integrate an analogue signal preconditioning circuit with a MoS2 photodetector.

Fig: a) Schematic of the back-gated transistor architecture; 
b) Transfer characteristics of a typical transistor on the chip (W/L = 4); 
c) View of a single OPA showing the pinout and transistor labelling

Circuit design and modelling: Because a complete model of back-gated 2D semiconductor FETs is still not readily available, we fitted the experimental results with an Enz–Krummenacher– Vittoz (EKV) model in both, the subthreshold and inversion, regimes. All the transistors operate in the inversion regime, we used the inversion model to simulate the OPA, obtaining a nominal low-frequency Atot gain value.

Acknowledgements: We thank A.J. Molina-Mendoza for technical assistance and N. Schaefer and J.A. Garrido for providing a polyimide substrate. We acknowledge financial support by the European Union (grant agreements 785219 Graphene Flagship, 796388 ECOMAT and 828901 ORIGENAL), the Austrian Science Fund FWF (START Y 539-N16) and the Italian MIUR (FIVE 2D).

Electronic Frontier Foundation Turns 30 This Year! Learn More About #EFF, and How You Can Help. https://t.co/jDPakWReaO #OpenSource https://t.co/7bDPyRYenl


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September 09, 2020 at 09:15AM
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Sep 8, 2020

#India now ranks among the #Top10 countries in terms of the number of #opensource projects [https://t.co/5VnCn8CErA] https://t.co/v2IsUB9ZZL https://t.co/ScATobwByx


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September 08, 2020 at 03:27PM
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[paper] RF Small-Signal Model for Four-Port Network MOSFETs

A High-Frequency Small-Signal Model for Four-Port Network MOSFETs
Alejandro Roman-Loera1, Member, IEEE, Anurag Veerabathini2, Member, IEEE, Luis A.Flores-Oropeza1, Member, IEEE, and Jaime Ramirez-Angulo3, Life Fellow, IEEE
IEEE 63rd IMWSCAS 2020
DOI:10.1109/mwscas48704.2020.9184475 

1Electronic Systems Department, Universidad Autonoma de Aguascalientes, Mexico.
2Maxim Integrated, Chandler, AZ, USA.
3Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA.

Abstract: A high-frequency small-signal model for a MOSFET is proposed considering the parasitic capacitances associated with each terminal that is critical in the design of high-frequency amplifiers. The proposed model allows in obtaining a closed form expression for poles and zeros due to parasitic elements along with the conventional poles and zeros. This model gives an additional degree of freedom in choosing the location of poles and zeros to improve the frequency response. The proposed high-frequency small-signal model for MOSFET is validated in simulation by implementing a high-frequency voltage follower in 0.18µm CMOS process. The proposed model shows the existence of a zero in a voltage follower that is introduced by the parasitic elements at high-frequencies and it is validated with implementation.

Fig: Small signal equivalent circuit of a 4-port MOSFET (a) Conventional model, (b) Model with substrate parasitics, and (c) Model with additional parasitics, and (d) Proposed model.

Acknowledgment: This work has been supported by PRODEP program from SEP (Secretariat of Public Education, Mexico) and Universidad Autonoma de Aguascalientes, Aguascalientes, Mexico.

Sep 7, 2020

#25 #Microchips That Shook the #World - IEEE Spectrum https://t.co/XCdh3S0ClW #semi https://t.co/JFWuLICVDT

1968 Fairchild Semiconductor μA741 Op-Amp
1971 Signetics NE555 Timer
1971 Western Digital WD1402A UART
1973 Mostek MK4096 4-Kilobit DRAM
1975 MOS Technology 6502 Microprocessor
1976 Zilog Z80 Microprocessor
1978 Texas Instruments TMC0281 Speech Synthesizer
1979 Intel 8088 Microprocessor
1979 Motorola MC68000 Microprocessor
1983 Intersil ICL8038 Waveform Generator
1983 Texas Instruments TMS32010 Digital Signal Processor
1985 Acorn Computers ARM1 Processor
1985 Chips & Technologies AT Chip Set
1985 Xilinx XC2064 FPGA
1986 Kodak KAF-1300 Image Sensor
1987 Sun Microsystems SPARC Processor
1987 Texas Instruments Digital Micromirror Device
1988 Computer Cowboys Sh-Boom Processor
1989 Toshiba NAND Flash Memory
1993 Microchip Technology PIC 16C84 Microcontroller
1994 Amati Communications Overture ADSL Chip Set
1997 IBM Deep Blue 2 Chess Chip
1997 Micronas Semiconductor MAS3507 MP3 Decoder
1998 Tripath Technology TA2020 AudioAmplifier
2000 Transmeta Corp. Crusoe

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September 07, 2020 at 03:57PM
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[paper] Vertical Graphene–hBCN Heterostructure TFETs

A comparative computational study of tunneling transistors
based on vertical graphene–hBCN heterostructures
Mahsa Ebrahimi1, Ashkan Horri1, Majid Sanaeepur2, and Mohammad Bagher Tavakoli1
J. Appl. Phys. 127, 084504 (2020); DOI: 10.1063/1.5130777
Published Online: 28 February 2020

1Department of Electrical Engineering, Arak Branch, Islamic Azad University, Arak, Iran
2Department of Electrical Engineering, Faculty of Engineering, Arak, Iran

ABSTRACT In this paper, the electrical characteristics of tunneling transistors based on vertical graphene and a hexagonal boron-carbon-nitrogen (hBCN) heterostructure are studied and compared theoretically. We have considered three different types of hBCN, i.e., BC2N, BC2N0, and BC6N as a tunneling barrier. Our simulation is based on the nonequilibrium Green’s function formalism along with an atomistic tightbinding (TB) model. The TB parameters are obtained by fitting the band structure to first-principles results. By using this method, electrical characteristics of the device, such as the ION=IOFF ratio, subthreshold swing, and intrinsic gate-delay time, are investigated. For a fair comparison, the effects of geometrical variations and number of tunneling barrier layers on the electrical parameters of the device are simulated and investigated. We show that, by an appropriate design, the device can be used for low-power or high-performance applications. The device allows current modulation exceeding 106 at room temperature for a 0.6 V bias voltage.

FIG. DFT Band structure for (a) graphene - hBC2N0 - graphene (b) graphene - hBC2N - graphene and (c) graphene - hBC6N - graphene supercell. BC and BV represent barrier height in the conduction band and valence band, respectively, all simulated with QUANTUM ESPRESSO: A modular and opensource software for quantum simulations of materials

OFETs Compact Modeling

Advances in Compact Modeling of Organic Field-Effect Transistors
Sungyeop Jung1, Member, IEEE, Yvan Bonnassieux2, Gilles Horowitz2, Sungjune Jung1, Member, IEEE, Benjamin Iñiguez3, Fellow, IEEE, and Chang-Hyun Kim4, Senior Member, IEEE
IEEE J-EDS (Early Access)
DOI: 10.1109/JEDS.2020.3020312

1Future IT Innovation Laboratory and Department of Creative IT Engineering, Pohang University of Science and Technology, Pohang 37673, South Korea.
2LPICM, Ecole Polytechinque, CNRS, 91128 Palaiseau, France.
3DEEEA, Universitat Rovira i Virgili, Tarragona 43007, Spain.
4Department of Electronic Engineering, Gachon University, Seongnam 13120, South Korea

Abstract: In this review, recent advances in compact modeling of organic field-effect transistors (OFETs) are presented. Despite the inherent strength for printed flexible electronics and the extremely aggressive research conducted over more than three decades, the OFET technology still seems to remain at a relatively low technological readiness level. Among various possible reasons for that, the lack of a standard compact model, which effectively bridges the device- and system-level development, is clearly one of the most critical issues. This paper broadly discusses the essential requirements, up-to-date progresses, and imminent challenges for the OFET compact device modeling toward a universal, physically valid, and applicable description of this fast-developing technology.

Figure (a) Cross-sectional illustration and (b) circuit diagram with multi-component overlap capacitances of the printed 3-D organic complementary inverter, and (c) measured and simulated transient output voltage of an 11-stage ring oscillator.



Sep 3, 2020

[eBook] download figures: POWER/HVMOS Devices Compact Modeling

27/08/2020

Today we are pleased to share your Annual Book Performance Report with you, which summarizes the number of chapter downloads* in the first half of this year, the calendar year 2019 and previous years as applicable.
POWER/HVMOS Devices Compact Modeling
YearUsage
01/2020 - 06/2020285
2019599
2018656
2017766
2016843
2015912
20141333
2013658
2012420
2011401
2010463

*Since its online publication on Jun 10, 2010, there have been a total of 7336 chapter downloads for your eBook on SpringerLink. The table above shows the download figures for the last year(s).
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Broadband Measurements to 220 GHz

VectorStar ME7838G 70 kHz to 220 GHz Single Sweep VNA Measurements and On-Wafer Calibrations

  • Miniature mmWave MA25400A NLTL module connects directly to probes without cables for best dynamic range and stability
  • MPI TITAN Probes available in 50, 75, and 100 um pitch
  • Probes are field replaceable
On-wafer calibrations:
  • SOLT up 40 or 70 GHz if standards provide required performance
  • LRM, ALRM, LRRM, and multiline TRL up to 220 GHz
  • SOLR when thru is not 0 length, is not well matched, insertion loss is less known, and there is no .s2p file describing the thru
Calibration substrates:
  • Available from MPI
  • When possible, use a ceramic chuck to minimize the potential for multimode parasitic propagation.
  • Alternatively, use an isolation wafer on metal chuck if available

[paper] Wearable Energy Harvester

A Piezoelectric-Transducer-Biased 3-D Photosensitive Thin-Film Transistor
as a Dual-Mode Wearable Energy Harvester
Emad Iranmanesh1, Weiwei Li2,3, Ahmed Rasheed2,3, and Kai Wang2,3 (Member IEEE)
IEEE EDL, Vol. 41, No. 9, Sept. 2020
DOI: 10.1109/LED.2020.3009685

1School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510006, China.
2Guangdong Provincial Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou 510006, China
3State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou 510006, China

Abstract: This letter reports on a dual-mode wearable energy harvester that utilizes both piezoelectric and photoelectric effects. It integrates a piezoelectric transducer with a 3-D photosensitive dual-gate thin-film transistor (DGTFT) as a rectifier and a buffer. The energy conversion efficiency is enhanced by reducing the internal resistance of the 3-D photosensitive DGTFT upon light illumination. Such a dual-mode energy harvester is promising for wearable electronics.
Fig.: a) Schematic diagram of the proposed wearable dual-mode energy harvester formed by a polyvinylidene difluoride (PVDF) transducer integrated with a self-driven diode-connected 3-D photosensitive DGTFT as a buffer and a rectifier;  b) Equivalent circuit of the proposed dual-mode harvester.

Acknowlwgement: This work was supported by the Guangdong Innovative Research and Entrepreneurial Team Program under Grant 2014ZT05D340