#Modeling of flicker noise in quasi-ballistic FETs - IEEE Conference Publication https://t.co/JpropPaK27
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#Modeling of flicker noise in quasi-ballistic FETs - IEEE Conference Publication https://t.co/JpropPaK27
— Wladek Grabinski (@wladek60) November 2, 2017
Circuit-aging #modeling based on dynamic MOSFET degradation and its verification - IEEE Conference Publication https://t.co/QnZG525Y7R
— Wladek Grabinski (@wladek60) November 2, 2017
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How to pick a #winning #IoT #business #model https://t.co/YjMfxPAEZB http://pic.twitter.com/SDOt080Ka6
— Wladek Grabinski (@wladek60) October 30, 2017