[paper] Memory Technology – A Primer for Material Scientists.

Schenk, Tony, Milan Pesic, Stefan Slesazeck, Uwe Schroeder, and Thomas Mikolajick

Memory Technology–A Primer for Material Scientists

Reports on Progress in Physics (2020)

Abstract - From our own experience in the group, we know that there is quite a gap to bridge between scientists focused on basic material research and their counterparts in a close-to-application community focused on identifying and solving final technological and engineering challenges. In this review, we try to provide an easy-to-grasp introduction to the field of memory technology for materials scientists. As an understanding of the big picture is vital, we first provide an overview about the development and architecture of memories as part of a computer and point out some basic limitations that all memories are subject to. As any new technology has to compete with mature existing solutions on the market, today's mainstream memories are explained and the need for future solutions is highlighted. The most prominent contenders in the field of emerging memories are introduced and major challenges on their way to commercialization are elucidated. Based on these discussions, we derive some predictions for the memory market to conclude the paper.

TABLE OF CONTENTS

1. INTRODUCTION
2. OVERVIEW AND BASIC LIMITATIONS
3. COMMERCIALLY AVAILABLE MAINSTREAM MEMORIES

3.1. Static and Dynamic Random Access Memory (SRAM/DRAM)
3.2. Flash Memory and Solid-State Drive (SSD)
3.3. Magnetic Hard Disk Drives (HDD) and Magnetic Tapes
3.4. Outlook: Market Trends and Drivers

4. EMERGING MEMORIES

4.1. Resistance-based Read-out: Memory Concepts and Basic Considerations
4.2. Anion migration or valence change memory (VCM)
4.3. Cation migration or electrochemical metallization memory (ECM)
4.4. Phase change memory (PCM)
4.5. Magnetoresistive memory (MRM)
4.6. Ferroelectric Memory (FEM)
4.7. Miscellaneous

5. SUMMARY AND CONCLUSION

FIG: Evolution of the mainstream solutions for the respective memories classes. The introduction of Flash memory partially bridged a technology gap around the year 2009. Today, two types of so-called storage-class memories – a memory-type SCM (SCM 1) and a storage-type SCM (SCM 2) – were proposed to overcome the memory gap. NAND flash already fulfills the role of a mainstream SCM 2. For SCM 1, 3D XPoint could be a promising candidate, but is not a dominant mainstream memory. In future, we will likely see different types of SCMs and NV-RAM with different specifications as required by the respective application – because in the end, the overall system cost decides about the choice of the memory.

[paper] Benchmark Tests for MOSFET Thermal Noise Models

Scholten A.J., Smit G.D.J., Pijper R.M.T., Tiemeijer L.F.

Benchmark Tests for MOSFET Thermal Noise Models

In: Grasser T. (eds) Noise in Nanoscale Semiconductor Devices. Springer, Cham

Abstract - In today’s semiconductor industry, many traditional integrated device manufacturers (IDMs) are moving away from chip manufacturing, and transforming into fabless companies that use foundry services for manufacturing their ICs. This is especially true in the field of advanced CMOS technologies. In these companies-under-transformation, the work of the modeling engineer is changing: instead of building models from scratch themselves, most companies choose to use the modeling packages that are delivered by the foundries. There are two reasons to be skeptical about RF noise models. First, measurement of noise, and RF noise in particular, is a difficult and specialist topic. One should not take for granted that every company has the required expertise to carry out this task successfully. A second reason to check RF noise models is that the most popular compact MOSFET models are BSIM4 [1] and BSIMBULK [2], which are not particularly strong and certainly not predictive when it comes to RF noise. As a consequence, the work of the modeling engineer is changing from model creation to model verification.

Tab: Overview of benchmark tests for thermal noise

#No	Bias	Length	Quantity	Test	Remark
#1	VDS = 0V	All	SID	γ = 1
#2	VDS = 0 V	All	SIG	β = 5/12
#3	VDS = 0 V	All	c	c = 0	In the limit f ↓ 0 Hz
#4	Weak Inv	All	SID	F = 1	Disregard SIG contributions from gate to drain
#5	Saturation	Long	SID	γ = 2/3
#6	Saturation	Long	SIG	β = 4/3
#7	Saturation	Long	c	c = 0.4j
#8	Saturation	Short	SID	γ enhancement	Switch off gate resistance
#9	Saturation	All	SID	γ D,NMOS ≥ γ D,PMOS	Switch off gate resistance
#10	Saturation	All	SID	Different Vth flavors should nearly coincide	When plotted against ID

First Online: 27 April 2020

DOI: 10.1007/978-3-030-37500-3_20

Ref: 

[1] N. Paydavosi, T.H. Morshed, D.D. Lu, W. Yang, M.V. Dunga, X. Xi, J. He, W. Liu, K.M. Cao, X. Jin, J.J. Ou, M. Chan, A.M. Niknejad, C. Hu, BSIM4v4.8.0 MOSFET Model - User’s Manual. [Online]. Available: http://bsim.berkeley.edu/models/bsim4/

[2] H. Agarwal, C. Gupta, H.-L. Chang, S. Khandelwal, J.P. Duarte, Y.S. Chauhan, S. Salahuddin, C. Hu, BSIM-BULK106.2.0 MOSFET Compact Model - Technical Manual. [Online]. Available: http://bsim.berkeley.edu/models/bsimbulk/

[paper] DHBT with Record ft of 813 GHz

Y. Shiratori, T. Hoshi and H. Matsuzaki,

InGaP/GaAsSb/InGaAsSb/InP Double Heterojunction Bipolar Transistors

With Record ft of 813 GHz

IEEE EDL vol. 41, no. 5, pp. 697-700, May 2020

doi: 10.1109/LED.2020.2982497

Abstract - We fabricated InGaP/GaAsSb/InGaAsSb/InP double heterojunction bipolar transistors (DHBTs) with an aggressive lateral and vertical scaling technology to improve the current gain cutoff frequency (f_T) further. A 13-nm-thick GaAsSb/InGaAsSb base and a 40-nm-thick InP collector are used to reduce electron transit time. In addition, the width of the base electrode on each side of the emitter is reduced to about 0.05µm to suppress increases in parasitic collector capacitance. A fabricated DHBT with the emitter size of 0.24µm×7.8 µm exhibits maximum differential current gain of ∼95 and collector-emitter breakdown voltage of 2.6V. At a collector current density of 18 mA/µm², the DHBT exhibits f_T of 813 GHz, which is the highest among all types of transistors measured at a room temperature.

Fig: (a) Current gain ( |h21| ) and Mason’s unilateral power gain (Ug ) of the DHBT as a function of frequency. JC and VCE are 18 mA/μm2 and 1.0 V, respectively. ft and fmax are extrapolated by single-pole fitting. Inset: frequency dependence of extrapolating ft and fmax . (b) Gummel’s ft extraction (imaginary part of 1/h21 as a function of frequency). The red circles and black line show experimental data and a linear fitting, respectively.

URL: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9044299&isnumber=9079222

[paper] Physical Mechanisms of Reverse DIBL and NDR in FeFETs With Steep Subthreshold Swing

C. Jin, T. Saraya, T. Hiramoto and M. Kobayashi,

in IEEE J-EDS, vol. 8, pp. 429-434, 2020

doi: 10.1109/JEDS.2020.2986345

Abstract - We have investigated transient IdVg and IdVd characteristics of ferroelectric field-effect transistor (FeFET) by simulation with ferroelectric model considering polarization switching dynamics. We show transient negative capacitance (TNC) with polarization reversal and depolarization effect can result in sub-60mV/dec subthreshold swing (SS), reverse drain-induced barrier lowering (R-DIBL), and negative differential resistance (NDR) without traversing the quasi-static negative capacitance (QSNC) region of the S-shaped polarization-voltage (PV) predicted by single-domain Landau theory. Moreover, the mechanisms of R-DIBL and NDR based on the TNC theory are discussed in detail. The results demonstrated in this work can be a possible explanation for the mechanism of previously reported negative capacitance field-effect transistor (NCFET) with sub-60mV/dec SS, R-DIBL, and NDR.

Equivalent circuits of a ferroelectric capacitor in both static and transient conditions.

#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs," in IEEE J-EDS, vol. 8, pp. 407-412, 2020. https://t.co/SCTs7BsGJZ https://t.co/gZcCgMrYVd

#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs," in IEEE J-EDS, vol. 8, pp. 407-412, 2020. https://t.co/SCTs7BsGJZ

pic.twitter.com/gZcCgMrYVd

— Wladek Grabinski (@wladek60) April 30, 2020

from Twitter https://twitter.com/wladek60

April 30, 2020 at 03:13PM
via IFTTT