#paper Alam, M.N.K., Roussel, P., Heyns, M. et al. Positive non-linear capacitance: the origin of the steep subthreshold-slope in ferroelectric FETs. Sci Rep 9, 14957 (2019) doi:10.1038/s41598-019-51237-2 https://t.co/zWwduLz8pB https://t.co/6pXnXiXjW8

#paper Alam, M.N.K., Roussel, P., Heyns, M. et al. Positive non-linear capacitance: the origin of the steep subthreshold-slope in ferroelectric FETs. Sci Rep 9, 14957 (2019) doi:10.1038/s41598-019-51237-2 https://t.co/zWwduLz8pB pic.twitter.com/6pXnXiXjW8

— Wladek Grabinski (@wladek60) November 7, 2019

from Twitter https://twitter.com/wladek60

November 07, 2019 at 10:24AM
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#Google Is Helping Design an #OpenSource, Ultra-Secure #Chip. #OpenTitan is a so-called secure enclave based on open source that could shake up hardware security. https://t.co/Kaqgh5xTh0 https://t.co/CiL5HGuoJa

#Google Is Helping Design an #OpenSource, Ultra-Secure #Chip. #OpenTitan is a so-called secure enclave based on open source that could shake up hardware security. https://t.co/Kaqgh5xTh0 pic.twitter.com/CiL5HGuoJa

— Wladek Grabinski (@wladek60) November 6, 2019

from Twitter https://twitter.com/wladek60

November 06, 2019 at 05:07PM
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N. Makris, M. Bucher, F. Jazaeri and J. Sallese, "CJM: A Compact #Model for Double-Gate Junction FETs," in IEEE JEDS. doi: 10.1109/JEDS.2019.2944817 https://t.co/3kba45imdB https://t.co/9WqLtmG2Jl

N. Makris, M. Bucher, F. Jazaeri and J. Sallese, "CJM: A Compact #Model for Double-Gate Junction FETs," in IEEE JEDS.
doi: 10.1109/JEDS.2019.2944817 https://t.co/3kba45imdB pic.twitter.com/9WqLtmG2Jl

— Wladek Grabinski (@wladek60) November 6, 2019

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November 06, 2019 at 05:03PM
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Si2 Compact Model Coalition Releases #SPICE #Model for Advanced IC Designs Twenty #CMC Members Benefit from 18-Month Access to New Standard Model https://t.co/yQyblGXwuG https://t.co/nUX9XtQESq

Si2 Compact Model Coalition Releases #SPICE #Model for Advanced IC Designs
Twenty #CMC Members Benefit from 18-Month Access to New Standard Modelhttps://t.co/yQyblGXwuG pic.twitter.com/nUX9XtQESq

— Wladek Grabinski (@wladek60) November 5, 2019

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November 05, 2019 at 04:42PM
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#paper A. Rassekh, F. Jazaeri, M. Fathipour and J. Sallese, "Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects," in IEEE TED, vol. 66, no. 11, pp. 4653-4659, Nov. 2019. doi: 10.1109/TED.2019.2944193 https://t.co/Ccg4wQtcG5 https://t.co/sBLZMVxcZo

#paper A. Rassekh, F. Jazaeri, M. Fathipour and J. Sallese, "Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects," in IEEE TED, vol. 66, no. 11, pp. 4653-4659, Nov. 2019.
doi: 10.1109/TED.2019.2944193 https://t.co/Ccg4wQtcG5 pic.twitter.com/sBLZMVxcZo

— Wladek Grabinski (@wladek60) November 5, 2019

from Twitter https://twitter.com/wladek60

November 05, 2019 at 02:41PM
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