Nov 5, 2019

#paper A. Rassekh, F. Jazaeri, M. Fathipour and J. Sallese, "Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects," in IEEE TED, vol. 66, no. 11, pp. 4653-4659, Nov. 2019. doi: 10.1109/TED.2019.2944193 https://t.co/Ccg4wQtcG5 https://t.co/sBLZMVxcZo


from Twitter https://twitter.com/wladek60

November 05, 2019 at 02:41PM
via IFTTT

No comments: