Sorin Cristoloveanu; Fully Depleted Silicon-On-Insulator:
Nanodevices, Mechanisms and Characterization
2021 Elsevier B.V.
2021 Elsevier B.V.
ISBN: 978-0-12-819643-4
Fully Depleted Silicon-On-Insulator provides an in-depth presentation of the fundamental and pragmatic concepts of this increasingly important technology.
There are two main technologies in the marketplace of advanced CMOS circuits: FinFETs and fully depleted silicon-on-insulators (FD-SOI). The latter is unchallenged in the field of low-power, high-frequency, and Internet-of-Things (IoT) circuits. The topic is very timely at research and development levels. Compared to existing books on SOI materials and devices, this book covers exhaustively the FD-SOI domain.
Key Features:
- Written by a top expert in the silicon-on-insulator community and IEEE Andrew Grove 2017 award recipient
- Comprehensively addresses the technology aspects, operation mechanisms and electrical characterization techniques for FD-SOI devices
- Discusses FD-SOI’s most promising device structures for memory, sensing and emerging applications
Table of Contents:
Front MatterPrefacePart I: TechnologyChapter 1 - FD-SOI technology pp. 3-37Part II: Mechanisms in FD-SOI MOSFETChapter 2 - Coupling effects pp. 41-70Chapter 3 - Scaling effects pp. 71-114Chapter 4 - Floating-body effects pp. 115-138Part III: Electrical characterization techniques for FD-SOI structuresChapter 5 - The pseudo-MOSFET pp. 141-177Chapter 6 - Diode-based characterization methods pp. 179-200Chapter 7 - Characterization methods for FD-SOI MOSFET pp. 201-238Part IV: Innovative FD-SOI devicesChapter 8 - Electrostatic doping and related devices pp. 241-265Chapter 9 - Band-modulation devices pp. 267-298Chapter 10 - Emerging devices pp. 299-348FD-SOI teasers pp. 349-352Index