Semiconductor Devices Characterization Seminar

Technical Seminars addressing the challenges of CMOS, Power and RF

semiconductor device measurement and modeling 

Agilent and it´s 25 collaborative partners invite you to attend this complimentary technical seminar on characterization and modeling of semiconductor devices. Two tracks in parallel will address the needs for:

• Small scale silicon industry
• Power silicon industry and RF Power

Common topics to both Tracks:

• Live demonstration of GaN device characterization flow: DC I-V characteristic extraction, RF Power measurement, Spice models creation for further usage in design stage.

CMOS Track:

• Accurate and repeatable on-the-wafer device extraction – Cascade Microtech
• DC characterization for emerging nano-technologies
• Flicker Noise and Random Telegraph Noise
• Spice model libraries optimization for dedicated application

Power & RF Power Track:

• High Power Devices measurement
• III-V devices spice model (DynaFET)
• Nonlinear Component characterization
• Non-50ohm Load Pull solution – Maury

Where/when:
To obtain the detail agenda of the nearest session, please select one of the locations below.

Country	City	Date	More Information
FR	Grenoble	18 September 2014	Register here
FI	Helsinki	23 September 2014	Register here
DE	Munich	30 September 2014	Register here
DE	Dresden	2 October 2014	Register here
CH	Lausanne	14 October 2014	Register here
BE	Leuven	16 October 2014	Register here
NL	Eindhoven	17 October 2014	Register here
SW	Goteborg	28 October 2014	Register here
UK	Cambridge	30 October 2014	Register here
FR	Les Ulis	6 November 2014	Register here