Wednesday, 30 July 2014

Semiconductor Devices Characterization Seminar

Technical Seminars addressing the challenges of CMOS, Power and RF
semiconductor device measurement and modeling 
Agilent and it´s 25 collaborative partners invite you to attend this complimentary technical seminar on characterization and modeling of semiconductor devices. Two tracks in parallel will address the needs for:
  • Small scale silicon industry
  • Power silicon industry and RF Power
Common topics to both Tracks:
  • Live demonstration of GaN device characterization flow: DC I-V characteristic extraction, RF Power measurement, Spice models creation for further usage in design stage.
CMOS Track:
  • Accurate and repeatable on-the-wafer device extraction – Cascade Microtech
  • DC characterization for emerging nano-technologies
  • Flicker Noise and Random Telegraph Noise
  • Spice model libraries optimization for dedicated application
Power & RF Power Track:
  • High Power Devices measurement
  • III-V devices spice model (DynaFET)
  • Nonlinear Component characterization
  • Non-50ohm Load Pull solution – Maury
Where/when:
To obtain the detail agenda of the nearest session, please select one of the locations below.
CountryCityDateMore Information
FRGrenoble18 September 2014Register here
FIHelsinki23 September 2014Register here
DEMunich30 September 2014Register here
DEDresden2 October 2014Register here
CHLausanne14 October 2014Register here
BELeuven16 October 2014Register here
NLEindhoven17 October 2014Register here
SWGoteborg28 October 2014Register here
UKCambridge30 October 2014Register here
FRLes Ulis6 November 2014Register here


 

 

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