Friday, 3 June 2011

Course on Statistical CMOS Variability and Reliability, San Jose CA, June 13th and 14th

Professor Asen Asenov, CEO of Gold Standard Simulations, will be delivering a comprehensive course (see the flyer) on variability and reliability issues and their impact on modern CMOS devices and design.

The course topics include, Variability classification,Sources of statistical variability, Simulation of statistical variability, Variability trends in conventional and novel MOSFETs, Random telegraph noise statistics, Statistical aspects of reliability, Statistical compact model strategies and Statistical circuit simulation. At this event there will also be a special lecture on Variability in FinFET devices.

For more information please visit: http://www.goldstandardsimulations.com/courses/ or get in touch with them at courses(at)goldstandardsimulations.com.

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