Apr 29, 2020

#paper: K. Xia, "New C∞ Functions for Drain–Source Voltage Clamping in Transistor Modeling," in IEEE TED, vol. 67, no. 4, pp. 1764-1768, April 2020. https://t.co/N9yGopiPNg https://t.co/9AKubeYY5x


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April 29, 2020 at 04:16PM
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#paper: E. A. Gutiérrez-D., J. Méndez-V., J. C. Tinoco, E. T. Rios and O. V. Huerta-G., "DC and 28 GHz Reliability of a SOI FET Technology," in IEEE J-EDS, vol. 8, pp. 385-390, 2020. https://t.co/slotpnOx43 https://t.co/sfZjtH0CPq

XXII ESCOLA SUL DE MICROELETRÔNICA: EMicro 2020 XXXV SIMPÓSIO SUL DE MICROELETRÔNICA: SIM 2020 27-30 April 2020 Virtual Event: https://t.co/DzzZLK7lIF Recordings: https://t.co/RuFy6pR6Qa #paper https://t.co/bItZC5bjWv


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April 29, 2020 at 09:21AM
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