#paper: K. Xia, "New C∞ Functions for Drain–Source Voltage Clamping in Transistor Modeling," in IEEE TED, vol. 67, no. 4, pp. 1764-1768, April 2020.https://t.co/N9yGopiPNg pic.twitter.com/9AKubeYY5x
— Wladek Grabinski (@wladek60) April 29, 2020
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April 29, 2020 at 04:16PM
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