Apr 30, 2019

Apr 29, 2019

P. Kushwaha et al., "Characterization and Modeling of Flicker #Noise in #FinFETs at Advanced Technology Node," in IEEE Electron Device Letters. doi: 10.1109/LED.2019.2911614 https://t.co/RuzIYlIOiL #paper https://t.co/y7lpjHI02W


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April 29, 2019 at 09:32AM
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Apr 26, 2019

A Compact Model for Border Traps in Lateral MOS Devices with Large Channel Resistance https://t.co/p9sOA4A8Ee #paper


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April 26, 2019 at 09:14PM
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A Quick #TSMC 2019 Tech Symposium Overview #FinFET https://t.co/NzINOJTciz #paper


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April 26, 2019 at 02:29PM
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