P. Kushwaha et al., "Characterization and Modeling of Flicker #Noise in #FinFETs at Advanced Technology Node," in IEEE Electron Device Letters. doi: 10.1109/LED.2019.2911614 https://t.co/RuzIYlIOiL #paper https://t.co/y7lpjHI02W

P. Kushwaha et al., "Characterization and Modeling of Flicker #Noise in #FinFETs at Advanced Technology Node," in IEEE Electron Device Letters.
doi: 10.1109/LED.2019.2911614 https://t.co/RuzIYlIOiL #paper pic.twitter.com/y7lpjHI02W

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April 29, 2019 at 09:32AM
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