[paper] Vertical Junction-Less Nanowire FETs

C. Maneux (University of Bordeaux), C. Mukherjee (CNRS), M. Deng (University of Bordeaux), G. Larrieu (CNRS), Y. WANG, B. Wesling, and H. Rezgui (University of Bordeaux)

Strategies for Characterization and Parameter Extraction of Vertical Junction-Less Nanowire FETs Dedicated to Design Technology Co-Optimization

H02-1863 (Invited) at 243rd ECS Meeting and SOFC-XVIII 

Boston, MA, May 29 - June 2, 2023

Abstract: In the era of emerging computing paradigms and artificial neural networks, hardware and functionality requirements are in the surge. In order to meet low power and latency criteria, new architectures for in-memory computing are being explored as alternatives to traditional von Neumann machines, which requires technological breakthrough at the semiconductor device level such as vertical gate-all-around junctionless nanowire field effect transistors (VNWFET), that can address many process challenges such as downscaling, short-channel effects, compactness and electrostatic control. Its integration in the mainstream design flow is not straightforward and requires design technology co-optimization (DTCO) at an early stage. This invited paper explores strategies for accurate characterization and parameter extraction of the VNWFETs to feed the DTCO compact models

Fig: Final verification using full 3D multiphysics device thermal simulation, accounting for both ballistic and diffusive heat flux

[paper] Implementation of Low Power Inverter using JL DG TFET

Sabitabrata Bhattacharya and Suman Lata Tripathi

Implementation of Low Power Inverter 

using Si1‑xGex Pocket N & P‑Channel Junction‑Less Double Gate TFET

Silicon, Springer Nature B.V. 2021

Received: 19 October 2021 / Accepted: 16 December 2021

DOI: 10.1007/s12633-021-01628-w

  

* School of Electronics and Electrical Engineering, Lovely Professional University, Phagwara, Punjab, India

Abstract: In this paper tunnel field effect transistor is reintroduced as an efficient low power replacement of MOSFET. The main draw- backs of TFET devices, like low ON-state current and low ION/IOFF ratio, are removed by structural and material modifica- tions. The proposed device is named junction-less double gate TFET or JL DGTFET. The junction-less attribute is used to reduce fabrication complexity, double gate is used to have better control over channel conduction and enhance drive current, high k gate dielectric and high work function gate metal is used to increase ON current. Low band gap Si1-xGex pocket is used near source end of the device to further improve performance. Four-fold optimization of the device is done along with temperature analysis to propose the best possible structure and dimensions. The proposed junction-less DGTFET was found to show huge performance improvement in ION/IOFF (of the order of 1011) and short channel parameters (SS = 63.5 mV/dec- ade, DIBL = 22.2 mV/V) over existing TFET devices. Both N & P-channel of the device is implemented with the optimised values on 18 nm technology node. Finally, an inverter circuit using both the N & P-channel devices is implemented following the CMOS compatible structure, and it is found to give very good results at low power.

Fig: Design of inverter circuit using n-JL DGTFET and p- JL DGTFET

Acknowledgements: The authors acknowledge for the support and lab facility provided by department of VLSI design, School of Electronics and Electrical Engineering, Lovely Professional University, Punjab India.