Cristina Medina-Bailon, Tapas Dutta, Fikru Adamu-Lema, Ali Rezaei, Daniel Nagy,
Vihar P. Georgiev, and Asen Asenov
Nano-Electronic Simulation Software (NESS):
A Novel Open-Source TCAD Simulation Environment
Journal of Microelectronic Manufacturing
Vol 3 (4) : 20030407 2020
DOI: 10.33079/jomm.20030407
Abstract: This paper presents the latest status of the open source advanced TCAD simulator called Nano-Electronic Simulation Software (NESS) which is currently under development at the Device Modeling Group of the University of Glasgow. NESS is designed with the main aim to provide an open, flexible, and easy to use simulation environment where users are able not only to perform numerical simulations but also to develop and implement new simulation methods and models. Currently, NESS is organized into two main components: the structure generator and a collection of different numerical solvers; which are linked to supporting components such as an effective mass extractor and materials database. This paper gives a brief overview of each of the components by describing their main capabilities, structure, and theory behind each one of them. Moreover, to illustrate the capabilities of each component, here we have given examples considering various device structures, architectures, materials, etc. at multiple simulation conditions. We expect that NESS will prove to be a great tool for both conventional as well as exploratory device research programs and projects.
Fig: Randomly generated atomistic device considering random discrete dopants (RDD) and metal gate granularity (MGG) in the NESS simulation domain
Acknowledgments: This project was initiated by the European Union Horizon 2020 research and innovation programme under grant agreement No. 688101 SUPERAID7 and has received further funding from EPSRC UKRI Innovation Fellowship scheme under grant agreement No. EP/S001131/1 (QSEE), No. EP/P009972/1 (QUANTDEVMOD) and No. EP/S000259/1 (Variability PDK for design based research on FPGA/neuro computing); and from H2020-FETOPEN-2019 scheme under grant agreement No.862539-Electromed-FET OPEN. The coauthors would like to thank Dr. Carrillo-Nuñez, Dr. Lee, Dr. Berrada, Dr. Badami, and Dr. Duan for their former contribution to NESS; as well as Dr. Donetti for the possibility of using the 1DMC tool.
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