Verified Measurements for Successful Device Models
at IHP in Frankfurt (Oder), June 15-17, 2016
Good electronic device modeling results depend directly on reliable, qualified and verified measurements. It is a known fact that problems with device models are – to a big part – rather due to measurement problems. Within the measurement chain of DC, Impedance (CV), S-Parameter, Nonlinear RF, and Noise, there are several challenges to overcome like device self-heating, contact resistance, max. applicable RF power, calibration, de-embedding etc.
IHP Summer Tutorial will take place at IHP in Frankfurt (Oder), June 15-17, 2016. It will cover in detail all these measurement domains, will explain the setups, the data verification methods, the traps to be avoided, and give best-practice recommendations and examples. It will be enhanced by live measurements in IHP’s measurement labs.
As a wrap-up, an introduction into device modeling, applying the qualified and verified measurements, will be given at the end.
Who should attend: Semiconductor manufacturing and measurement engineers, device modeling engineers, scientists and students working/interested in measurement techniques.
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