Thursday, June 4, 2009

IEEE SCV EDS Electron Device talks for June

"Negative Bias Temperature Instability in p-MOSFETs: Fundamentals, Characterization, Materials Dependence and Modeling"
Speaker: Dr. Souvik Mahapatra, Dept. of Electrical Engineering, IIT Bombay
Date: Tuesday, June. 9, 2009
Location: National Semiconductor, Building E1, Conference Center, 2900 Semiconductor Drive, Santa Clara, CA 95051.

More information at the IEEE Santa Clara Valley EDS Chapter Home Page.

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