CICC 2020 March 22 – March 25, 2020 Virtually from anywhere! https://t.co/6LMk0g4HDq #paper https://t.co/FTH07ngklp

CICC 2020
March 22 – March 25, 2020
Virtually from anywhere!
https://t.co/6LMk0g4HDq#paper pic.twitter.com/FTH07ngklp

— Wladek Grabinski (@wladek60) March 9, 2020

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March 09, 2020 at 04:03PM
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The New Dates of SEMICON/FPD China 2020 https://t.co/m1znJk8eKK #paper https://t.co/nUAveoEvpl

The New Dates of SEMICON/FPD China 2020https://t.co/m1znJk8eKK#paper pic.twitter.com/nUAveoEvpl

— Wladek Grabinski (@wladek60) March 6, 2020

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March 06, 2020 at 01:15PM
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#paper: Y. Liu, S. Yang and K. Sheng, "Design and Optimization of Vertical GaN PiN Diodes With Fluorine-Implanted Termination," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 241-250, 2020 doi: 10.1109/JEDS.2020.2975220 https://t.co/34ZWW1P73Y https://t.co/hKNGErgo4I

#paper: Y. Liu, S. Yang and K. Sheng, "Design and Optimization of Vertical GaN PiN Diodes With Fluorine-Implanted Termination," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 241-250, 2020

doi: 10.1109/JEDS.2020.2975220https://t.co/34ZWW1P73Y pic.twitter.com/hKNGErgo4I

— Wladek Grabinski (@wladek60) March 6, 2020

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March 06, 2020 at 09:17AM
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#paper: S. Mocevic et al., "Comparison and Discussion on Shortcircuit Protections for SiC MOSFET Modules: Desaturation vs. Rogowski Switch-Current Sensor," in IEEE Transactions on Industry Applications doi: 10.1109/TIA.2020.2972816 https://t.co/qYVwtxy2BF https://t.co/Z4oY9m6Dhl

#paper: S. Mocevic et al., "Comparison and Discussion on Shortcircuit Protections for SiC MOSFET Modules:
Desaturation vs. Rogowski Switch-Current Sensor," in IEEE Transactions on Industry Applications

doi: 10.1109/TIA.2020.2972816https://t.co/qYVwtxy2BF pic.twitter.com/Z4oY9m6Dhl

— Wladek Grabinski (@wladek60) March 5, 2020

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March 05, 2020 at 03:59PM
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#paper: Q. Huo et al., "Physics-Based Device-Circuit Cooptimization Scheme for 7-nm Technology Node SRAM Design and Beyond," in IEEE Transactions on Electron Devices, vol. 67, no. 3, pp. 907-914, March 2020 doi: 10.1109/TED.2020.2964610 https://t.co/wEf5wGKzFv https://t.co/AGBu4ZUtVR

#paper: Q. Huo et al., "Physics-Based Device-Circuit Cooptimization Scheme for 7-nm Technology Node SRAM Design and Beyond," in IEEE Transactions on Electron Devices, vol. 67, no. 3, pp. 907-914, March 2020

doi: 10.1109/TED.2020.2964610 https://t.co/wEf5wGKzFv pic.twitter.com/AGBu4ZUtVR

— Wladek Grabinski (@wladek60) March 5, 2020

from Twitter https://twitter.com/wladek60

March 05, 2020 at 03:56PM
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