#DATE 2020 in Grenoble replaced by a virtual conference that will be scheduled in the coming weeks https://t.co/vwd8IZqhPo #paper https://t.co/FNMBVw2LUl

#DATE 2020 in Grenoble
replaced by a virtual conference that will be scheduled in the coming weeks https://t.co/vwd8IZqhPo#paper pic.twitter.com/FNMBVw2LUl

— Wladek Grabinski (@wladek60) March 5, 2020

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March 05, 2020 at 03:30PM
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#EDTM 2020 Conference going Virtual -The conference will be held as a Virtual conference with all presentations be posted online. -The pre-conference Tutorials and Short Courses on March 15th, 2020 is cancelled https://t.co/x9cC8kKu6D #paper https://t.co/M8C5uO6DQY

#EDTM 2020 Conference going Virtual
-The conference will be held as a Virtual conference with all presentations be posted online.
-The pre-conference Tutorials and Short Courses on March 15th, 2020 is cancelledhttps://t.co/x9cC8kKu6D#paper pic.twitter.com/M8C5uO6DQY

— Wladek Grabinski (@wladek60) March 5, 2020

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March 05, 2020 at 03:24PM
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#paper: Krishna Pradeep, Patrick Scheer, Thierry Poiroux, André Juge and Gerard Ghibaudo; In-Wafer variability in FD-SOI MOSFETs: Detailed analysis and statistical modelling" Accepted Manuscript online 27 February 2020 by IOP Publishing Ltd https://t.co/rEjVnoRLuH https://t.co/V98FnxCpeo

#paper: Krishna Pradeep, Patrick Scheer, Thierry Poiroux, André Juge and Gerard Ghibaudo; In-Wafer variability in FD-SOI MOSFETs: Detailed analysis and statistical modelling" Accepted Manuscript online 27 February 2020 by IOP Publishing Ltdhttps://t.co/rEjVnoRLuH pic.twitter.com/V98FnxCpeo

— Wladek Grabinski (@wladek60) March 4, 2020

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March 04, 2020 at 02:51PM
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#paper #PhD: Michael Kollmitzer: Modeling of reverse current effects in trench-based smart power technologies. Gottfried Wilhelm Leibniz Universität, Diss., 2019, viii, 141 S. DOI: https://t.co/Uz3n1mRzzt https://t.co/mbBC0FR04m https://t.co/CVFveW4DXr

#paper #PhD: Michael Kollmitzer: Modeling of reverse current effects in trench-based smart power technologies. Gottfried Wilhelm Leibniz Universität, Diss., 2019, viii, 141 S.
DOI: https://t.co/Uz3n1mRzzthttps://t.co/mbBC0FR04m pic.twitter.com/CVFveW4DXr

— Wladek Grabinski (@wladek60) March 4, 2020

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March 04, 2020 at 02:34PM
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#paper: S. Rhee et al. "Extension of the DG Model to the Second-Order Quantum Correction for Analysis of the Single-Charge Effect in Sub-10-nm MOS Devices," in IEEE JEDS, vol. 8, pp. 213-222, 2020 doi: 10.1109/JEDS.2020.2971426 https://t.co/LhdoMi9pP3 https://t.co/YgUVWiBxlv

#paper: S. Rhee et al. "Extension of the DG Model to the Second-Order Quantum Correction for Analysis of the Single-Charge Effect in Sub-10-nm MOS Devices," in IEEE JEDS, vol. 8, pp. 213-222, 2020

doi: 10.1109/JEDS.2020.2971426 https://t.co/LhdoMi9pP3 pic.twitter.com/YgUVWiBxlv

— Wladek Grabinski (@wladek60) March 3, 2020

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March 03, 2020 at 08:23AM
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