#paper: Krishna Pradeep, Patrick Scheer, Thierry Poiroux, André Juge and Gerard Ghibaudo; In-Wafer variability in FD-SOI MOSFETs: Detailed analysis and statistical modelling" Accepted Manuscript online 27 February 2020 by IOP Publishing Ltdhttps://t.co/rEjVnoRLuH pic.twitter.com/V98FnxCpeo
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March 04, 2020 at 02:51PM
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