#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact modeling of 1/f noise for amorphous ESL IGZO TFTs," in IEEE JEDS.
— Wladek Grabinski (@wladek60) February 10, 2020
doi: 10.1109/JEDS.2020.2970177 https://t.co/kDjMe1zkI1 pic.twitter.com/eiCLzkBAJP
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February 10, 2020 at 02:17PM
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