Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019 https://t.co/ppz92LZnNi #paper https://t.co/7hmMCY5rvx

Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019https://t.co/ppz92LZnNi #paper pic.twitter.com/7hmMCY5rvx

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 11:58AM
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B. K. Esfeh, V. Kilchytska, N. Planes, M. Haond, D. Flandre and J. Raskin, "28-nm FDSOI nMOSFET RF Figures of Merits and Parasitic Elements Extraction at Cryogenic Temperature Down to 77 K," in IEEE JEDS, vol. 7, pp. 810-816, 2019. https://t.co/VXOuHjBAWI #paper https://t.co/mT1vV0psze

B. K. Esfeh, V. Kilchytska, N. Planes, M. Haond, D. Flandre and J. Raskin, "28-nm FDSOI nMOSFET RF Figures of Merits and Parasitic Elements Extraction at Cryogenic Temperature Down to 77 K," in IEEE JEDS, vol. 7, pp. 810-816, 2019.
https://t.co/VXOuHjBAWI #paper pic.twitter.com/mT1vV0psze

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 09:54AM
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低频噪声测试在新兴半导体材料和器件物理机制探索的应用研究 Application Research of Low Frequency Noise Testing in the Exploration of Emerging Semiconductor Materials and Devices Physical Mechanism https://t.co/Y9lDjd1kPn #paper https://t.co/6X4218ejOF

低频噪声测试在新兴半导体材料和器件物理机制探索的应用研究
Application Research of Low Frequency Noise Testing in the Exploration of Emerging Semiconductor Materials and Devices Physical Mechanismhttps://t.co/Y9lDjd1kPn #paper pic.twitter.com/6X4218ejOF

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 09:15AM
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V. Veliadis, "The Impact of Education in Accelerating Commercialization of Wide-Bandgap Power Electronics [Expert View]," in IEEE Power Electronics Magazine, vol. 6, no. 2, pp. 62-66, June 2019 doi: 10.1109/MPEL.2019.2910715 https://t.co/R14V6BDxXR #paper https://t.co/NnTfIqzaRR

V. Veliadis, "The Impact of Education in Accelerating Commercialization of Wide-Bandgap Power Electronics [Expert View]," in IEEE Power Electronics Magazine, vol. 6, no. 2, pp. 62-66, June 2019

doi: 10.1109/MPEL.2019.2910715 https://t.co/R14V6BDxXR #paper pic.twitter.com/NnTfIqzaRR

— Wladek Grabinski (@wladek60) August 26, 2019

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August 26, 2019 at 08:45PM
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IEEE Annual Election: IEEE President-Elect Candidate: DEJAN S. MILOJICIC, PhD https://t.co/YGXMj7XzQM (Nominated by IEEE Board of Directors) Distinguished Technologist; Hewlett Packard Labs Palo Alto, California, USA https://t.co/eCpVS4yzu9 #paper https://t.co/4b8EOTaQMF

IEEE Annual Election: IEEE President-Elect Candidate: DEJAN S. MILOJICIC, PhD https://t.co/YGXMj7XzQM (Nominated by IEEE Board of Directors) Distinguished Technologist; Hewlett Packard Labs Palo Alto, California, USA
https://t.co/eCpVS4yzu9 #paper pic.twitter.com/4b8EOTaQMF

— Wladek Grabinski (@wladek60) August 26, 2019

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August 26, 2019 at 05:36PM
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