8.3% Efficiency in a OPV

I copy from their webpage:

Konarka's Power Plastic Achieves World Record 8.3% Efficiency Certification from National Energy Renewable Laboratory (NREL)

Lowell, Mass. - Nov. 29, 2010 - Konarka Technologies, Inc., an innovator in development and commercialization of Konarka Power Plastic®, a material that converts light to energy, today announced that the National Energy Renewable Laboratory (NREL) has certified that Konarka’s organic based photovoltaic (OPV) solar cells have demonstrated a record breaking 8.3% efficiency. This is the highest performance recorded by NREL for an organic photovoltaic solar cell.
"The progress Konarka has achieved this year with regard to solar cell efficiency is unprecedented, representing a significant milestone for the industry," commented Howard Berke, chairman, CEO and co-founder of Konarka. "This unsurpassed NREL certification opens new doors for the commercial production of cost-effective, efficient electricity for numerous large scale applications."
Konarka Power Plastic is a patent-protected thin film solar material that converts light to energy. The unique material is lightweight and flexible, lending itself to a wide range of applications where traditional photovoltaics are not effective.
The latest certification results are for Konarka’s large area single-junction solar cell with a surface area of 1 square centimeter. This efficiency rating far exceeds previous single-junction organic photovoltaic cell measurement on that surface area and represents the world record for OPV efficiency.

24th International Conference on Microelectronic Test Structures (ICMTS)

The IEEE Electron Devices Society sponsors the 24th International Conference on Microelectronic Test Structures (ICMTS).

The conference will be held on April 5-7, 2011, in downtown Amsterdam (The Netherlands) at the Royal Academy of Arts and Sciences, and will be preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on April 4. The program further includes a company exhibit and various social events in and around the Academy. 

Registration to the conference is now open. If you wish more info, please visit their website http://icmts2011.ewi.utwente.nl/ for further information.

[mos-ak] Final Program MOS-AK/GSA Workshop in San Francisco

Please visit the MOS-AK/GSA San Francisco web site with the final
workshop program:
http://www.mos-ak.org/california/

* Free On-line Registration Form:
http://www.mos-ak.org/california/registration.php

* Venue: The JW Marriott Union Square, San Francisco, CA
http://www.marriott.com/hotels/travel/sfojw-jw-marriott-san-francisco-union-square/

* Agenda
Dec. 8, 2010: MOS-AK/GSA Workshop co-located with the CMC Meeting and
IEDM Conference
9:00 - 12:00: Morning Session - Chair: Ian Getreu
13:00 - 16:00: Afernoon Session - Chair: Larry Nagel
http://www.mos-ak.org/california/

MOS-AK/GSA Happy Hour at Noma Gallery
after 18:00 - Discussion, networking and...
80 Maiden Ln. 3rd fl, San Francisco, CA
http://www.nomagallerysf.com/artists/NOMA_GALLERY/index.html

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Senior Research Engineer - MEMS circuits

Responsibilities:

Electro-mechanical computing has recently emerged as a very promising solution for ultra-low-power and high temperature circuit applications. The candidate will be responsible of the development of nano-electromechanical components for computation applications (logic and memory devices). This research will include device physics and modeling, design, fabrication in the IME cleanroom and characterization of electro-mechanical devices and circuits. Reliability and failure testing of memory arrays will be conducted.

Requirements:

PhD degree in Mechanical Engineering, Electrical Engineering or Material Sciences. Hands-on experience on wafer level MEMS related works, including microfabrication process and work in a cleanroom environment. Familiar with electrical measurement techniques (device and memory arrays). Strong interest for MEMS multi-physics modeling. Excellent communication skills and teamwork with strong self-motivation. Interaction with industrial/academic partners expected.

Please contact Dr Vincent Pott for more information.

Position to remain open until a candidate is selected (apply online).

First comprehensive and systematic course on statistical variability

I am delighted to bring to your attention the first comprehensive and systematic course on statistical variability.

Dates: 11-12 January 2011 in Grenoble.

This first edition of the course is in collaboration with the SINANO Institute and the FP7 NoE NANOSIL. 

The course covers:

· Variability classification
· Sources of statistical variability
· Simulation of statistical variability
· Variability trends in conventional and novel MOSFETs
· Random telegraph noise statistics
· Statistical aspects of reliability
· Statistical compact model strategies
· Statistical circuit simulation

You can find the syllabus at:
http://www.goldstandardsimulations.com/courses/syllabus/ 

You will be able to register for the course soon at:

http://www.goldstandardsimulations.com/courses/.