I am delighted to bring to your attention the first comprehensive and systematic course on statistical variability.
Dates: 11-12 January 2011 in Grenoble.
This first edition of the course is in collaboration with the SINANO Institute and the FP7 NoE NANOSIL.
The course covers: · Variability classification · Sources of statistical variability · Simulation of statistical variability · Variability trends in conventional and novel MOSFETs · Random telegraph noise statistics · Statistical aspects of reliability · Statistical compact model strategies · Statistical circuit simulation
You can find the syllabus at: http://www.goldstandardsimulations.com/courses/syllabus/
You will be able to register for the course soon at: