Tuesday, 2 November 2010

First comprehensive and systematic course on statistical variability

I am delighted to bring to your attention the first comprehensive and systematic course on statistical variability.
Dates: 11-12 January 2011 in Grenoble.
This first edition of the course is in collaboration with the SINANO Institute and the FP7 NoE NANOSIL. 
The course covers:

· Variability classification
· Sources of statistical variability
· Simulation of statistical variability
· Variability trends in conventional and novel MOSFETs
· Random telegraph noise statistics
· Statistical aspects of reliability
· Statistical compact model strategies
· Statistical circuit simulation
You can find the syllabus at:
You will be able to register for the course soon at:

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