Feb 19, 2020

#paper: Liu, X., Gao, H., Ward, J.E. et al. Power generation from ambient humidity using protein nanowires. Nature (2020). https://t.co/1aOq5zyIIT Received: 19 November 2018 Accepted: 14 November 2019 Published: 17 February 2020 https://t.co/jr8305P63a https://t.co/9nbuIRTJ4u


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February 19, 2020 at 07:36AM
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Feb 18, 2020

#paper: J. L. Wang et al., "Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 145-151, 2020. doi: 10.1109/JEDS.2020.2971245 https://t.co/hP3ZZwd29B https://t.co/N2v6Si9TVN


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February 18, 2020 at 02:50PM
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33rd IEEE ICMTS, Edinburgh, Scotland.

IEEE 33rd International Conference on Microelectronic Test Structures
April 6-9, 2020, Edinburgh, Scotland

It is our great pleasure to invite you to the 33rd IEEE International Conference on Microelectronic Test Structure (ICMTS) which will be held April 6-9, 2020, in Edinburgh, Scotland.  
 
ICMTS is the leading measurement and characterisation conference for micro- and nano-fabrication processes including integrated circuits, photonics, and micro- and nano-system technologies.
 
Registration for the conference is now open at the conference website: http://www.icmts.net/conf_reg 
 
For advance prices please register for the conference before the 24th of February.  
 
ICMTS 2020
South Hall Complex
The University of Edinburgh
Pollock Halls, 18 Holyrood Park Road 
Edinburgh, EH16 5AR
Scotland, UK
 
 
Hotel booking information is also available:  http://www.icmts.net/hotel_reg  
 
Tutorials: April 6, 2020
Conference: April 7 - 9, 2020
 
Please contact the conference organisers at icmts@ed.ac.uk for more information.
 
Find the ICMTS group on LinkedIn https://www.linkedin.com/groups/3804498/ 
Follow us on Twitter at https://twitter.com/IEEE_ICMTS 

The Role of #OpenSource Software in #Engineering Education https://t.co/8lcKmG8D4K https://t.co/6gpwMFb2iP


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February 18, 2020 at 12:26PM
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Call 2020: EMBRAPII and Innosuisse are conducting a joint call for the first time. The call is open to innovations in all R&D topics. https://t.co/njR2Gun9Fm #paper https://t.co/6TuwTtXd92


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February 18, 2020 at 12:40PM
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Feb 17, 2020

The Future of Nanoelectronics Devices and Systems Beyond Moore Workshop March 30,2020 SiNANO https://t.co/nDbTR1WMgy #paper https://t.co/cBFO5FKXhM


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February 17, 2020 at 08:15PM
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Feb 14, 2020

#paper: S. Shen and J. Yuan, "1/ f^gamma Low Frequency Noise Model for Buried Channel MOSFET," in IEEE JEDS, vol. 8, pp. 126-133, 2020 doi: 10.1109/JEDS.2020.2967897 https://t.co/AkE3oMF8lI https://t.co/W750HJoXWL


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February 14, 2020 at 03:05PM
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Industrial Placement Sponsorships Available From #IEEE Electronic Devices Society #EDS https://t.co/icADeNBazu #paper https://t.co/n0iAfQAD1q


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February 14, 2020 at 11:20AM
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I ❤️ Free Software - Valentine's Day 2020 FSFE https://t.co/bXAlq7cDmN #paper https://t.co/HdPLWXripO


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February 14, 2020 at 09:01AM
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Postdoc in Millimeter-Wave Nano-Scale CMOS Circuits for Quantum Computing; Vacancy at Department of EE and Computer Engineering, Aarhus University Deadline 15 Feb; Fixed term full-time position: 1 Apr 2020 - 31 Mar 2022 [ID: 2624] https://t.co/WzYvgHWbsL #paper https://t.co/tLZvSd5Ktn

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February 14, 2020 at 07:12AM
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Feb 11, 2020

#paper: K. Li and S. Rakheja, “Modeling and Simulation of Quasi-Ballistic III-Nitride Transistors for RF and Digital Applications,” Int. J. Hi. Spe. Ele. Syst., vol. 28, no. 01n02, p. 1940011, Mar. 2019 doi: 10.1142/S0129156419400111 https://t.co/k3Rf5UGe8w https://t.co/SrmUC66YDz


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February 11, 2020 at 02:55PM
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#paper: B. Liu et al., "A Fully-Synthesizable Fractional-N Injection-Locked PLL for Digital Clocking with Triangle/Sawtooth Spread-Spectrum Modulation Capability in 5nm CMOS," in IEEE SSC Letters, vol. 3, pp. 34-37, 2020 doi: 10.1109/LSSC.2020.2967744 https://t.co/7YkX9vwaJ6 https://t.co/KO0oTZDHBV


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February 11, 2020 at 10:25AM
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ITE Piaseczno Branch, the only one Polish experimental technological line for #silicon #devices




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February 11, 2020 at 07:17AM
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Feb 10, 2020

#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact modeling of 1/f noise for amorphous ESL IGZO TFTs," in IEEE JEDS. doi: 10.1109/JEDS.2020.2970177 https://t.co/kDjMe1zkI1 https://t.co/eiCLzkBAJP


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February 10, 2020 at 02:17PM
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MIXDES deadline for regular paper submission is Feb. 29, 2020 This year the 27th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2020 will take place on June 25-27, 2020 in Wrocław (PL) https://t.co/yaP3bDfZE4 #paper https://t.co/XiMaf9zxmL


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February 10, 2020 at 12:46PM
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#paper: Nikolaos Mavredakis et al.; Low-frequency noise parameter extraction method for single layer graphene FETs; arXiv:2002.01666 [physics.app-ph] https://t.co/TApAeAaJGi https://t.co/KCBD4AqTau


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February 10, 2020 at 10:32AM
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IEEE International Conference on Flexible and Printable Sensors and Systems #FLEPS June 28 - July 1, 2020 | Hilton Deansgate Manchester, UK https://t.co/7ZEix4QohM #paper https://t.co/Q8JVPRXfZa


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February 10, 2020 at 10:08AM
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[paper] Inflection Phenomenon in Cryogenic MOSFET Behavior


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February 10, 2020 at 09:58AM
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Feb 7, 2020

#paper: Boran Wang, Ao Zhang, Yixin Zhang, Jianjun Gao; An approach for determining thermal resistance model parameters of SiGe HBT; IJNM, First published:20 May 2019 https://t.co/HpoAjc5Lhl https://t.co/KVfAx5nVGm


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February 07, 2020 at 08:14PM
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#paper: S. Hou, M. Shakir, P. Hellström, B. G. Malm, C. Zetterling and M. Östling, "A Silicon Carbide 256 Pixel UV Image Sensor Array Operating at 400 °C," in IEEE EDS Journal, vol. 8, pp. 116-121, 2020. doi: 10.1109/JEDS.2020.2966680 https://t.co/iGWEwYIxEb https://t.co/RAjaJj5zXJ


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February 07, 2020 at 05:11PM
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#paper: Zhongjie Ren and Yuan Taur; Non-GCA Modeling of Near Threshold I-V Characteristics of DG MOSFETs Available online 1 February 2020 In Press, SSE Journal Pre-proof https://t.co/jnt2d48q5J https://t.co/9hJayW79si


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February 07, 2020 at 04:33PM
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Feb 6, 2020

Heterogeneous Integration Roadmap #HIR: 3rd Annual Meeting – SCV Chapter, IEEE CPMT Society https://t.co/Hvqrz3J1o5 #paper https://t.co/Jbi32n8iOW


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February 06, 2020 at 01:16PM
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#paper: S. A. Albahrani et al., "Extreme Temperature Modeling of AlGaN/GaN HEMTs," in IEEE Transactions on Electron Devices, vol. 67, no. 2, pp. 430-437, Feb. 2020. doi: 10.1109/TED.2019.2960573 https://t.co/S6BSXBDxqn https://t.co/r2eBzzWvZS


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February 06, 2020 at 12:43PM
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The Fourth Terminal









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February 06, 2020 at 10:43AM
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Jan 31, 2020

#paper A. Dasgupta et al., "BSIM Compact Model of Quantum Confinement in Advanced Nanosheet FETs," in IEEE Transactions on Electron Devices, vol. 67, no. 2, pp. 730-737, Feb. 2020. doi: 10.1109/TED.2019.2960269 https://t.co/LgtatrREVT https://t.co/usKRwot9JD


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January 31, 2020 at 11:29PM
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Jan 29, 2020

#paper: S. A. Albahrani, L. Heuken, D. Schwantuschke, T. Gneiting, J. N. Burghartz and S. Khandelwal, "Consistent Surface-Potential-Based Modeling of Drain and Gate Currents in AlGaN/GaN HEMTs," in IEEE TED, vol. 67, no. 2, pp. 455-462, Feb. 2020. https://t.co/t7LRiwhN97 https://t.co/yEiLnbiY6x


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January 29, 2020 at 11:28AM
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Jan 28, 2020

#CMP provides new MPW access to #EMM 0.18µm CMOS 4/5ML EMALP018


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January 28, 2020 at 01:27PM
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How I #teach #physics using #opensource tools https://t.co/k9BqXvnOnx https://t.co/JDmMUVE0oF


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January 28, 2020 at 11:34AM
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Free Software Foundation behind petition to #OpenSource Windows 7 #win7 https://t.co/5EGnJZ9kmu https://t.co/9DqqP7uvWj


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January 28, 2020 at 09:18AM
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C4P: The 2020 edition of the International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) will be held in Erfurt, Germany, June 20-23, 2020 https://t.co/xPUVGkoCTh #paper https://t.co/t2oNgfkf8S


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January 28, 2020 at 09:13AM
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#paper: Michał Zaborowski, Daniel Tomaszewski, and Jacek Marczewski "A test structure for investigation of #junctionless #FETs as #THz radiation #sensors ", Proc. SPIE 10175, Electron Technology Conference 2016, 1017512 (22 December 2016); https://t.co/Fy92Ts2e8q https://t.co/XnBVyGWSTW


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January 28, 2020 at 07:27AM
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