Jan 24, 2010
Agilent Technologies Announces YouTube Channel for Agilent EEsof EDA
Agilent Technologies Inc. has announced the launch of the Agilent EEsof EDA channel on YouTube. The channel features more than 100 informational videos with subtitles in 50 different languages. The videos offer detailed application information on the Advanced Design System, Genesys, SystemVue, and other electronic design automation software from Agilent EEsof. The channel is designed to provide tutorial information to Agilent’s large installed base of users, or to anyone wanting to learn more about Agilent EEsof’s design software and high-frequency design applications. [more]
Jan 21, 2010
Some papers
I've seen five interesting papers in the current issue of the International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Volume 23, Issue 2, 2010.):
Pages: 88-106
Implementation of the symmetric doped double-gate MOSFET model in Verilog-A for circuit simulation Joaquín Alvarado, Benjamin Iñiguez, Magali Estrada, Denis Flandre, Antonio Cerdeira http://www3.interscience.wiley.com/journal/122527099/abstract Published Online: 30 Jul 2009 DOI: 10.1002/jnm.725 Pages: 107-126 New RF extrinsic resistances extraction procedure for deep-submicron MOS transistors J. C. Tinoco, J.-P. Raskin http://www3.interscience.wiley.com/journal/122581374/abstract Published Online: 1 Sep 2009 DOI: 10.1002/jnm.726 Pages: 127-139 Modelling CoolMOSC3 transistor characteristics in SPICE Krzysztof Górecki, Janusz Zar?bski http://www3.interscience.wiley.com/journal/122580694/abstract Published Online: 1 Sep 2009 DOI: 10.1002/jnm.727 Pages: 140-150 The compact d.c. electrothermal model of power MOSFETs for SPICE Janusz Zar?bski http://www3.interscience.wiley.com/journal/122582111/abstract Published Online: 1 Sep 2009 DOI: 10.1002/jnm.728 Pages: 151-163 Simple and accurate approaches to implement the complex trans-conductance suited for time-domain simulators for small-signal and large-signal table-based models Seyed Majid Homayouni, Dominique Schreurs, Bart Nauwelaers http://www3.interscience.wiley.com/journal/123242581/abstract Published Online: 15 Jan 2010 DOI: 10.1002/jnm.740
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