I'm sorry, but this is quite out of topic. One of my personal obsessions are organic circuits, and this month the IEEE Journal of Solid-State Circuits publishes two very promising papers:
A 13.56-MHz RFID System Based on Organic Transponders
and the other one:
An Organic FET SRAM With Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display
This means that it is more and more important having good models for plastic electronics. And this does not mean that we should be able to predict (more or less) the static curves, but also the gm and gds and, more and more important, the capacitances. This must be done if we are to implement full systems-on-display, as it seems to be the trend.
Feb 13, 2007
Feb 12, 2007
Some papers
I've been reading some new papers, and I've found some worth noticing:
The first one (Statistics of Grain Boundaries in Polysilicon),from H. Watanabe, is a quite interesting paper, discussing the application of statistics to a MOSFET model. I believe that the idea is applicable not only to bulk MOS, like he does, but it is somehow the path to follow for all the models devoted to devices where a signifiant parameter dispersion is expected. In fact, I think that this is a better way to face the problem than the one proposed by the EKV model, where they proposed a model for the deviations of the parameters.
And tomorrow, more...
The first one (Statistics of Grain Boundaries in Polysilicon),from H. Watanabe, is a quite interesting paper, discussing the application of statistics to a MOSFET model. I believe that the idea is applicable not only to bulk MOS, like he does, but it is somehow the path to follow for all the models devoted to devices where a signifiant parameter dispersion is expected. In fact, I think that this is a better way to face the problem than the one proposed by the EKV model, where they proposed a model for the deviations of the parameters.
And tomorrow, more...
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