[paper] Li, X., Zanotti, T., Wang, T., Zhu, K., Puglisi, F. M., Lanza, M., Random Telegraph Noise in Metal‐Oxide Memristors for True Random Number Generators: A Materials Study. Adv. Funct. Mater. 2021, 2102172. https://t.co/VuSUNNZbm4 https://t.co/xxa3wRpRSp#semi pic.twitter.com/8CSdM5cmYk
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