#paper: L. Liu, W. Chen, X. Liu and G. Du, "Photoelectric Characteristic Evaluation of Different Structured UTBB MOSFETs," in IEEE TED, vol. 67, no. 5, pp. 1919-1923, May 2020https://t.co/2onkfigdMS pic.twitter.com/XWNv6uZML9
— Wladek Grabinski (@wladek60) April 24, 2020
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April 24, 2020 at 05:49PM
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