#paper: M. Albrecht, F. J. Klüpfel and T. Erlbacher, "An Iterative Surface Potential Algorithm Including Interface Traps for Compact Modeling of SiC-MOSFETs," in IEEE TED, vol. 67, no. 3, pp. 855-862, March 2020 doi: 10.1109/TED.2020.2967507 https://t.co/8fJMfKM9SP https://t.co/nlRiSs1Qf0

#paper: M. Albrecht, F. J. Klüpfel and T. Erlbacher, "An Iterative Surface Potential Algorithm Including Interface Traps for Compact Modeling of SiC-MOSFETs," in IEEE TED, vol. 67, no. 3, pp. 855-862, March 2020
doi: 10.1109/TED.2020.2967507 https://t.co/8fJMfKM9SP 

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