The 2007 Workshop on Compact Modeling (WCM) will take place in Santa Clara (Silicon Valley, California) from May 20 to 24 2007.
WCM'07 is part of the NSTI Nanotech 2007 Conference, and is held in association with the Tenth International Conference on Modeling and Simulation of Microsystems (MSM 2007).
WCM is the main symposium devoted to the field of compact modeling of semiconductor devices. The WCM Workshop was created in 2002, thanks, especially, to Professor Xing Zhou, from Nanyang Technological University (Singapore), who has always been the WCM Chair.
The technical program of WCM is especially interesting this year. Some of the invited speakers are really big authorities in the field of semiconductor device modelling: Jerry Fossum, Chenming Hu, Narain Arora, Mark Lundstrom, Jamal Deen, Tor Fjeldly, Yuan Taur, Colin McAndrew, Mitiko Miura-Mattausch, Dirk Klaassen,...
There will be sessions devoted to different types of devices. Multiple Gate MOSFET modeling is certainly a very hot topic: there will be two sessions adressing these devices, and another session will also include papers on single and double gate SOI MOSFETs.
Among the papers to be presented regarding the modeling of Multiple Gate MOSFET modeling, we can highlight the presentation of a PSP-based scalable model for FinFETs, a work made by the PSP team.
On the other hand, WCM will include one interesting session focusing on statistical/process-based models.
I truly recommend all compact modeling developers to attend WCM'07. It is the workshop where the new ideas on compact modeling are first presented.