Sedemos News

Feb 18, 2020

33rd IEEE ICMTS, Edinburgh, Scotland.

IEEE 33rd International Conference on Microelectronic Test Structures

April 6-9, 2020, Edinburgh, Scotland

It is our great pleasure to invite you to the 33rd IEEE International Conference on Microelectronic Test Structure (ICMTS) which will be held April 6-9, 2020, in Edinburgh, Scotland.

ICMTS is the leading measurement and characterisation conference for micro- and nano-fabrication processes including integrated circuits, photonics, and micro- and nano-system technologies.

Registration for the conference is now open at the conference website: http://www.icmts.net/conf_reg

For advance prices please register for the conference before the 24th of February.

ICMTS 2020

South Hall Complex

The University of Edinburgh

Pollock Halls, 18 Holyrood Park Road

Edinburgh, EH16 5AR

Scotland, UK

W3W: https://w3w.co/proper.marked.sums

Hotel booking information is also available: http://www.icmts.net/hotel_reg

Tutorials: April 6, 2020

Conference: April 7 - 9, 2020

Please contact the conference organisers at icmts@ed.ac.uk for more information.

Find the ICMTS group on LinkedIn https://www.linkedin.com/groups/3804498/

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#paper: S. Shen and J. Yuan, "1/ f^gamma Low Frequency Noise Model for Buried Channel MOSFET," in IEEE JEDS, vol. 8, pp. 126-133, 2020 doi: 10.1109/JEDS.2020.2967897 https://t.co/AkE3oMF8lI https://t.co/W750HJoXWL

#paper: S. Shen and J. Yuan, "1/ f^gamma Low Frequency Noise Model for Buried Channel MOSFET," in IEEE JEDS, vol. 8, pp. 126-133, 2020

doi: 10.1109/JEDS.2020.2967897 https://t.co/AkE3oMF8lI pic.twitter.com/W750HJoXWL
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