Important dates :
- abstract submission deadline : January 30, 2020
- notification of acceptance : February 3, 2020
- postponed confernce dates : August 31st - September 4th 2020
• Advanced SOI materials and structures: physical mechanisms and innovative SOI-like devices
• New channel materials for CMOS: strained Si, strained SOI, SiGe, GeOI, III-V and high mobility materials on insulator, carbon nanotubes, graphene and other two-dimensional materials
• Properties of ultra-thin films and buried oxides: defects, interface quality, thin gate dielectrics, high-κ materials for switches and memory.
• Nanometer scale devices: technology, characterization techniques and evaluation metrics for high performance, low power, reliability, high frequency and memory applications
• Alternative transistor architectures: FDSOI, Nanowire, FinFET, MuGFET, vertical MOSFET, FeFET and Tunnel FET, MEMS/NEMS, Beyond-CMOS nanoelectronic devices
• New functionalities in silicon-compatible nanostructures and innovative devices representing the More than Moore domain: nanoelectronic sensors, biosensor devices, energy harvesting devices, RF devices, imagers, etc.
• CMOS scaling perspectives: device/circuit level performance evaluation, switches and memory scaling; three-dimensional integration of devices and circuits, heterogeneous integration
• Transport phenomena: compact modeling, device simulation, front- and back-end process simulation
• Advanced test structures and characterization techniques: parameter extraction, reliability and variability assessment techniques for new materials and novel devices
Need help or information : eurosoiulis2020@sciencesconf.org
Conference Chair: Bogdan Cretu