May 11, 2012

Programme of the 2nd Training Course on Compact Modeling

The 2nd Training Course on Compact Modeling (TCCM) will be held in Tarragona (Catalonia, Spain) on June 28-29 2012.
 It will be organized by the NEPHOS Group, of the Department of Electronic, Electrical and Automatic Control Engineering at the Universitat Rovira i Virgili (Tarragona)..
The General Chairman is myself, Prof. Benjamin Iñiguez.

The Training Course on Compact Modeling will consist of l2 lectures addressing relevant topics in the compact modeling of advanced electron devices. These lectures will be conducted by top experts in the field. Most of the lectures will target compact modeling issues applicable to many electron devices. In particular, emphasis will be given on MOSFETs (bulk, SOI, Multi-Gate and High Voltage MOS structures) and HEMTs.
Attendees will  get very useful information on the different aspects of advenced device modelling. This training course is therefore recommended to Master and Ph D students, as well as postdocs and early stage researchers in companies, and not necessarily doing research on modelling.

Here is the final programme of the Training Course on Compact Modeling



 8:30   Training Courses Opening Session
           Benjamin Iniguez (Universitat Rovira i Virgili, Tarragona, Spain)

8:55  "Tunnel and quasi-ballistic transport modelling in nanoscale MOS devices".
         Raphaël Clerc (Institut National Polytechnique de Grenoble, France)

11:15 Coffee break

11:40 "3D analytical modelling techniques for Tri-Gate MOS structures"
            Romain Ritzenthaler (IMEC, Belgium)

12:50 "S-parameter and nonlinear RF modelling"
            Franz Sischka (Agilent Technologies, Böblingen, Germany)

14:00   Lunch
15:15   "Low frequency noise modeling"
            Frédéric Martinez (Université de Montpellier 2, France)

16:25 Quantum confinement models for nanoelectronic devices
          David Jiménez (Universitat Autònoma de Barcelona, Spain)


20:30    Gala dinner
  

June 29 2012

8:45   "Thermal modelling of RF and microwave devices"
        Giovanni Ghione (Politecnico di Torino, Italy)

9:55  "Statistical modelling techniques"
        Colin C. McAndrew (Freescale Semiconductors, Phoenix, AZ, USA)

11:05  Coffee break

 
11:30 High frequency noise modeling
          Jamal Deen (McMaster University, Canada)

12:50  "QucsStudio: A second generation Qucs software package for compact semiconductor device model development based on interactive and compiled equation-defined modelling techniques plus circuit simulation"
           Mike Brinson (Metropolitan University of London, UK)

14:00   Lunch

15:15  "Flicker noise measurements and characterization"
           Thomas Gneiting (AdMOS GmbH, Frickenhausen, Germany)

16:25 "World-wide Model Standardization at the CMC, and DRAM Modeling Needs"
            Peter Lee (vice-chair of the Compact Modeling Council, Elpida Memory, Japan)





Look at:
http://compactmodelling.eu/tccm2_programme.php

The Training Course on Compact Modeling is an event sponsored by the FP7 “COMON” (COmpact MOdelling Network) IAPP Project (which is coordinated by the Universitat Rovira i Virgili) in collaboration with the IEEE EDS Compact Modeling Technical Committee.

  • Registration will be cheap, in particular before June 16 :
http://compactmodelling.eu/tccm2_registration.php and will include lunches, coffee breaks and a Gala Dinner on June 28th.































































May 7, 2012

[book] Lectures on the modeling elements of integrated circuits in microelectronics

Лекции по моделированию элементов интегральных схем микроэлектроники
Игорь Иванович Абрамов
ISBN: 978-3-8484-8201-6
LAP Lambert Academic Publishing (2012-04-11)

Apr 15, 2012

[mos-ak] MOS-AK/GSA India workshop on-line publications

MOS-AK/GSA India workshop on-line publications are available, 
visit: 
http://www.mos-ak.org/india/

The Workshop was co-organized by Indian National Academy of Engineering (INAE), supported by Ministry of Communication and IT (DIT), Government of India, Council of Scientific and Industrial Research (CSIR); Jaypee Institute of Information Technology (JIIT), Noida; with sponsorship provided by the microelectronic and semiconductor industry leaders: AMS, IBM, TI, STM, Cadence, Mentor Graphics and Masamb.

I would like to thank all MOS-AK/GSA speakers for sharing their compact modeling competence, R&D experience and delivering valuable MOS-AK/GSA presentations. I am sure, that our modeling event in Noida was a beneficial on to all the attendees as well as to all MOS-AK/GSA Group.

The MOS-AK India workshop press coverage is listed below
http://mos-ak.org/india/press.php

I hope, we would have a next chance to meet us with your academic and industrial partners at future MOS-AK/GSA modeling events (check the list below).

- with regards - WG (for the MOS-AK/GSA Committee
––––––––––––––––––––––––––––––––––---------------- 
MOS-AK/GSA Dresden April 26-27, 2012 
MIXDES Special Modeling Sesion Warsaw May 24-26, 2012 
MOS-AK/GSA Bordeaux Sept.21, 2012 
MOS-AK/GSA San Francisco Q4 2012 
––––––––––––––––––––––––––––––––––----------------

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Apr 10, 2012

PhD course on Nano-scale MOS transistors

Semi-classical modeling and applications
Udine, May 28 - June 1, 2012

Luca Selmi, David Esseni, Pierpaolo Palestri
DIEGM, Università degli Studi di Udine

The course aims at giving a description (in terms accessible to both physicists and electronic engineers) of advanced models for modern nano-MOSFET architectures exploiting technology boosters (strain, high-k materials, etc.) for enhanced channel mobility and reduced leakage. The prerequisite knowledge in physics is limited to the basic concepts of classical electrostatics and electrodynamics and elementary notions of quantum mechanics.

All information dealing with the application for such a scholarship and the eligibility criteria can be found on
http://www.euro-dots.org/Students-rules.asp
and
http://www.euro-dots.org/Students-steps.asp

To register, please call +39 0432 558251 or e-mail it to palestri@uniud.it

DEADLINE FOR ADVANCED REGISTRATION: APRIL 28, 2012

Apr 5, 2012

4th Regional Seminar "Computer simulation and design of micro- nano- and microelectromechanical systems"

Natural Sciences Faculty FSEIHPE "State University - teaching, research and production complex"
Physics Department
Teaching and research laboratory instrument-technological modeling of micro-and nano-electronics 

March 30, 2012, Orel, Naugorskoe Av. 29

Seminar Program [translated by Google

  1. S. Matyukhin 1, Welcome to the participants
    1 State University-UNPK
  2. A VO Turin, 2 Zebra G.I.2 3 Dorofeev, AA, Device-technological simulation of self-heating in GaN HEMT ,
    1-UNPK State University,
    2 NRNU "MiFi"
    3 3FGUP NPP "Pulsar"
  3. A VO Turin, 2 Zebra GI, 3 Inigez B3, 4, Shur MS, Correct account of non-zero differential conductivity in a compact model of MOSFET in saturation due to self-heating effect and because korotkokanalnyh effects ,
    1-UNPK State University,
    2 NRNU "MiFi"
    3 University of Rovira and Virginia, Spain,
    4 Rensselaerovsky Polytechnic Institute, USA
  4. Garanovich D. Drozdov, DG, EM Savchenko Design devices from electrostatic discharge protection for bipolar integrated circuits ,
    FSUE NPP "Pulsar"
  5. Drozdov, DG, EM Savchenko, Siomko VO Study of models for the calculation of heterostructure transistors based on AlGaN / GaN
    FSUE NPP "Pulsar"
  6. Siomko VO, Drozdov, DG, EM Savchenko, Research methods for calculating the breakdown voltage of transistors based on heterostructures AlGaN / GaN
    FSUE NPP "Pulsar"
  7. A Kozil Z., S. Birner 2, 3 Dupuis, AR, Nextnano: device-technological modeling of transport in quantum well semiconductor lasers with a double restriction
    1-UNPK State University,
    2 Walter Schottky Institut, Technische Universität Munchen, Germany,
    3 Matco Industries Inc., Scarborough, Ontario, Canada
  8. Kozil Z., Differential resistance characteristics of the current-voltage characteristics of semiconductor lasers with a double restriction and optical efficiency
    State University-UNPK
  9. Titushkin DA, Matyukhin SI, Modeling of electron-optical system, light-emitting diodes in the package Sentaurus TCAD software company Synopsys ,
    State University-UNPK
  10. Makulevsky GR, Malyj DO, Matyukhin S., Investigation of the dependence of characteristics of RO DHS laser waveguide structure by taking into account the thermal effects ,
    State University-UNPK
  11. Malyj DO, Makulevsky G.R, Matyukhin SI, Effect of heat on the electrical and optical characteristics of semiconductor lasers, DHS PO using the instrument-technological methods of modeling
    State University-UNPK
  12. Tsyrlov AM, Cherkasov, MA, Technical requirements for analysis tools and simulation of high-power devices, switching equipment ,
    JSC «Proton»
  13. Chernyshov, KN, Matyukhin S., Computer simulation of the diffusion technology of IGBT ,
    State University-UNPK
  14. 1.2 AA Pisarev, a Matyukhin SI, 2 Stavtsev AV Computer simulation of the thyristor
    1-UNPK State University,
    2 ZAO "Proton-Electrotex"
  15. A Stoudennikov AS, a Turin VO 2 Tsyrlov AM, Compact modeling of silicon vertical MOSFET with double diffusion in the program Quite Universal Circuit Simulator
    1-UNPK State University,
    2 of "Proton"
  16. 1 Turin, VO, VV Ivanov 1, 2 Tsyrlov AM, 3 Martemyanov IS, Simulation of a silicon vertical MOSFET with double diffusion in the program Synopsys TCAD ,
    1-UNPK State University,
    2 of "Proton"
    3 ETU "LETI"