Nov 26, 2019

#paper W. Grabinski et al., "FOSS EKV2.6 Verilog-A Compact MOSFET Model," ESSDERC, Krakow, Poland, 2019, pp. 190-193. doi: 10.1109/ESSDERC.2019.8901822 https://t.co/rONWC5mTQE https://t.co/Sw8iobvIai


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November 26, 2019 at 09:13PM
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Nov 19, 2019

[Conference Reports] 2019 Symposia on VLSI Technology and Circuits: Pushing the Limits of Semiconductors for a United and Connected World in IEEE SSC Magazine, vol. 11, no. 4, pp. 83-86, Fall 2019 doi: 10.1109/MSSC.2019.2939456 https://t.co/f51V2MT0S9 #paper https://t.co/pe9IUWra4X


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November 19, 2019 at 08:47PM
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MOS-AK India #45395 is now published in IEEE Xplore

2019 IEEE Conference on Modeling of Systems Circuits and Devices 
(MOS-AK India) - #45395 
is now published in IEEE Xplore

Conference Record #45395

Dear Arifuddin Sohel, Desai UB, Govindacharyulu P.A, Wladek Grabinski, Venkatesh N

Congratulations! 2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India) has been posted to the IEEE Xplore digital library effective 2019-11-18.

Along with publication in IEEE Xplore, IEEE assures wide distribution of conference proceedings by providing abstracting and indexing information of all individual conference papers to worldwide databases. IEEE makes every reasonable attempt to ensure that abstracts and index entries of content accepted into the program are included in databases provided by independent abstracting and indexing services. Each abstracting and indexing partner makes its own editorial decision on what content to include. IEEE cannot guarantee entries are included in any particular database.

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#paper J. Trommer, M. Simon, S. Slesazeck, W. M. Weber and T. Mikolajick, "Eliminating Charge Sharing in Clocked Logic Gates on the Device Level Employing Transistors with Multiple Independent Inputs," ESSDERC 2019, Krakow, 10.1109/ESSDERC.2019.8901730 https://t.co/xGNhchlT24 https://t.co/RpSsxIkfe8


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November 19, 2019 at 05:51PM
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#paper K. Harrouche, R. Kabouche, E. Okada and F. Medjdoub, "High Performance and Highly Robust AlN/GaN HEMTs for Millimeter-Wave Operation," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 1145-1150, 2019. doi: 10.1109/JEDS.2019.2952314 https://t.co/jNkb9EJ9Zn https://t.co/eVGvTeltX5


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November 19, 2019 at 02:54PM
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