Jul 24, 2018

Analysis of the Channel and Contact Regions in Staggered and Drain-Offset ZnO Thin-Film Transistors With #Compact #Modeling - IEEE Journals & Magazine https://t.co/T4cI4ySoH1 https://t.co/T4cI4ySoH1


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July 24, 2018 at 09:18PM
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Analysis of the Channel and Contact Regions in Staggered and Drain-Offset ZnO Thin-Film Transistors With #Compact #Modeling - IEEE Journals & Magazine https://t.co/T4cI4ySoH1


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July 24, 2018 at 09:18PM
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Characterization and #Modeling of Temperature Effects in #3D #NAND Flash Arrays—Part II: Random Telegraph #Noise https://t.co/gQUJCnoP3O


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July 24, 2018 at 05:13PM
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A Physics-Based #Compact #Model of #SiC Junction Barrier Schottky Diode for Circuit Simulation - Published in: IEEE Transactions on Electron Devices ( Volume: 65, Issue: 8, Aug. 2018 ) https://t.co/68fIGLy7M8 https://t.co/68fIGLy7M8


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July 24, 2018 at 10:12AM
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