Characterization and #Modeling of Temperature Effects in #3D #NAND Flash Arrays—Part II: Random Telegraph #Noise https://t.co/gQUJCnoP3O
— Wladek Grabinski (@wladek60) July 24, 2018
Semianalytical #modeling of the depletion layers and their effects on the #threshold #voltage of a #junctionless double‐gate MOSFET including trapped charges - Beigi - - IJNM - Wiley Online Library https://t.co/P6T6PSop2t https://t.co/P6T6PSop2t
— Wladek Grabinski (@wladek60) April 17, 2018
Compact #Modeling of Proximity Effect in High- ${Q}$ Tapered Spiral Inductors - IEEE Journals & Magazine https://t.co/dsVW3ux2UJ https://t.co/dsVW3ux2UJ
— Wladek Grabinski (@wladek60) March 25, 2018
Capacitive #RF #MEMS switch design and simulation https://t.co/z6KeAsfzac #Modeling pic.twitter.com/GeegWnsUDG
— Wladek Grabinski (@wladek60) March 22, 2018
Si2 Approves IC Design Simulation Standards for Gallium Nitride Devices https://t.co/Paz8lLEngY #Modeling pic.twitter.com/XfGGQtef4f
— Wladek Grabinski (@wladek60) March 15, 2018
[1889 reeds] Open-source circuit simulation tools for RF compact semiconductor device #modeling pic.twitter.com/OeqgG1ChLD
— Wladek Grabinski (@wladek60) March 9, 2018
Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit... https://t.co/N6U0dXHmu1
— Wladek Grabinski (@wladek60) February 25, 2018
Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit Design - IEEE Journals & Magazine https://t.co/MNRwd2XitA
— Wladek Grabinski (@wladek60) February 25, 2018
Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals &... https://t.co/xp2Ff5Tlcp
— Wladek Grabinski (@wladek60) February 24, 2018
Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals & Magazine https://t.co/yTSpsNriwQ
— Wladek Grabinski (@wladek60) February 24, 2018
Extraction of Process Variation Parameters in FinFET Technology Based on Compact #Modeling and Characterization https://t.co/1RTYdSlig5
— Wladek Grabinski (@wladek60) February 24, 2018
Extraction of #Process #Variation Parameters in FinFET Technology Based on #Compact #Modeling and... https://t.co/vqTFtfDxWG
— Wladek Grabinski (@wladek60) January 30, 2018
Extraction of #Process #Variation Parameters in FinFET Technology Based on #Compact #Modeling and Characterization - IEEE Journals & Magazine https://t.co/6RlUeQ3fhp
— Wladek Grabinski (@wladek60) January 30, 2018
Physics-Based #Modeling of TID Induced Global Static Leakage in Different #CMOS Circuits https://t.co/OLjRR8MFge http://pic.twitter.com/xcJ8XFdkt9
— Wladek Grabinski (@wladek60) December 29, 2017
RT @Chip_Insider: Models are becoming more difficult to develop, integrate and utilize effectively at 10/7nm and beyond https://t.co/3m6l5Ce1Qp#modeling #10nm #7nm #simulation https://t.co/EEz5woRm86
— Wladek Grabinski (@wladek60) December 29, 2017
Surrogate #modeling and variability analysis of on‐chip spiral #inductors https://t.co/X2hm6rNKwd
— Wladek Grabinski (@wladek60) December 16, 2017
#Modeling and #Simulation for Meeting the Challenges of #Battery Design https://t.co/o1mjcSnbx1... https://t.co/wYayKWbxAZ
— Wladek Grabinski (@wladek60) December 6, 2017
#Modeling and #Simulation for Meeting the Challenges of #Battery Design https://t.co/o1mjcSnbx1 http://pic.twitter.com/SjHho90M7V
— Wladek Grabinski (@wladek60) December 6, 2017
#Modeling of Quantum Confinement and Capacitance in III–V Gate-All-Around 1-D Transistors https://t.co/Ql0DQWQ5hf
— Wladek Grabinski (@wladek60) November 25, 2017
ngspice release 27, September 17th, 2017 https://t.co/0jSKnj19no #Modeling http://pic.twitter.com/c5INhqX0yD
— Wladek Grabinski (@wladek60) November 7, 2017
