Thursday, February 1, 2018

F. Rasheed, M. S. Golanbari, G. Cadilha Marques, M. B. Tahoori and J. Aghassi-Hagmann, "A Smooth EKV-Based DC #Model for Accurate Simulation of Printed Transistors and Their Process Variations," in IEEE TED, vol. 65, no. 2, pp. 667-673, Feb. 2018.https://t.co/vQ0xogjSx4


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February 01, 2018 at 07:56PM
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