The first edition of the Training Courses on Compact Modeling (TCCM) will consist of a set of lectures addressing relevant topics in the compact modeling of advanced electron devices. Most of the courses will target compact modeling issues applicable to many electron devices. In particular, emphasis will be given on MOSFETs (bulk, SOI, Multi-Gate and High Voltage MOS structures) and HEMTs.
The Training Courses on Compact Modeling will be held in Tarragona (Catalonia, Spain) on June 30-July 1, in coordination with two other events partially or totally related to compact modeling: the 8th Graduate Student Meeting on Electronic Engineering (June 28-29) and the 3rd International Workshop on Compact Thin Film Transistor Modeling (July 2).
The Training Courses on Compact Modeling are sponsored by the FP7 “COMON” IAPP Project and the Universitat Rovira i Virgili in collaboration with the IEEE EDS Compact Modeling Technical Committee.
The Training Courses on Compact Modeling will be especially suited to researchers from both industry and academia working on electron device modeling, circuit and systems design and electronic design automated tools. In particular, the courses will be very interesting and useful to students working on these topics.
The General Chair Person is Prof. Benjamin Iñiguez, Universitat Rovira i Virgili, Tarragona, Spain.
The advanced registration fee will be 100 Euro for students and 130 Euro for non-students. After June 13, the registration fee is 150 Euro for students and 180 Euro for non-students. Members of the teams participating in the COMON project are exempted from paying the fee.
A total of 10 lectures will be conducted. Tthe final programme, with the timetable, will be available soon.
1. Tibor Grasser (TU-Wien) - Transport modeling
2. Tor A Fjeldly (UniK, Norway) - Analytical 2D and 3D electrostatic modeling
3. Jamal Deen (McMaster University, Canada) - Noise modeling
4. Benjamin Iniguez (URV, Spain) - Analytical small-signal modeling
5. Ilcho Angelov (Chalmers University, Sweden) - High frequency device modeling
6. Renaud Gillon (On Semiconductor, Belgium) - Electro-thermal and reliability modeling
7. Sorin Cristoloveanu (MINATEC and LETI, France) - Electrical characterization of SOI and Multi-Gate MOSFETs
8. Asen Asenov (University of Glasgow) - Statistical variability and corresponding compact model strategies
9. Kiyoh Itoh (Hitachi, Japan) - "Variability-conscious Circuit Designs for Low-voltage Nano-scale CMOS LSIs"
10. Wladek Grabinski - "GNU/Open Source CAD Tools for Verilog-A Compact Model Standardization"