IEEE Papers in April 2009

Two nice papers:

A Compact Model for Undoped Silicon-Nanowire MOSFETs With Schottky-Barrier Source/Drain
Zhu, G.; Zhou, X.; Lee, T. S.; Ang, L. K.; See, G. H.; Lin, S.; Chin, Y. K.; Pey, K. L.
Abstract

Metal-Gate FinFET Variation Analysis by Measurement and Compact Model
O'uchi, S.; Matsukawa, T.; Nakagawa, T.; Endo, K.; Liu, Y.; Sekigawa, T.; Tsukada, J.; Ishikawa, Y.; Yamauchi, H.; Ishii, K.; Suzuki, E.; Koike, H.; Sakamoto, K.; Masahara, M.
Abstract