The 21st IEEE International Conference on Microelectronic Test Structures (ICMTS) will be held in Edinburgh, Scotland, March 24-27 2008.
ICMTS has become a well established conference addressing topics such as test structures, material, process and device characterization techniques, compact device model parameter extraction and reliability analysis.
In 2008 ICMTS will be organized by the University of Edinburgh. Extended abstracts should be submitted by September 14 2007.
From my experience, ICMTS is a very interesting forum to present new methods to extract parameters of compact device models. In the recent times there has been emphasis on parameter extraction from RF measurements. Also ICMTS allows a very useful interaction between researchers coming from characterization teams and compact modeling teams. On the other hand, I want to highlight that ICMTS uses to have a very nice social programme.