* Electrical and Computer Engineering (ECE), Georgia Institute of Technology (USA)
Oct 31, 2023
[paper] Analog System Synthesis for Reconfigurable Computing
* Electrical and Computer Engineering (ECE), Georgia Institute of Technology (USA)
Oct 30, 2023
[paper] DEVSIM
Oct 27, 2023
[paper] STT-MTJ Device Model
General-Purpose STT-MTJ Device Model Based on the Fokker-Planck Equation
IEEE Transactions On Nanotechnology, VOL. 22, 2023 659 A
DOI: 10.1109/TNANO.2023.3322468.
Oct 26, 2023
[chapter] Extraction for a 65nm FG Transistor.
[book] Microelectronic Circuits
Appendix
- B. SPICE Device Models and Design with Simulation Examples
Oct 25, 2023
[paper] Sub-THz HICUM for SiGe HBTs
IMS laboratory, CNRS, University of Bordeaux (F)
Department of Electrical Engineering, IIT Madras (IN)
STMicroelectronics, 38920 Crolles (F)
Oct 23, 2023
[paper] Lorentzian noise spectra in compact models
* School of Electrical & Computer Engineering, Technical University of Crete (TUC), GR-73100 Chania, Greece European University on Responsible Consumption and Production (EURECA-PRO) (Joint affiliation)
† Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas (IESL-FORTH), GR-71110 Heraklion, Greece
Oct 17, 2023
[mos-ak] [2nd Announcement] 16th International MOS-AK Workshop Silicon Valley, Dec. 13, 2023
- Compact Modeling (CM) of the electron devices
- Advances in semiconductor technologies and processing
- Verilog-A language for CM standardization
- New CM techniques and extraction software
- Open Source (FOSS) TCAD/EDA modeling and simulation
- CM of passive, active, sensors and actuators
- Emerging Devices, Organic TFT, CMOS and SOI-based memory
- Microwave, RF device modeling, high voltage device modeling
- Device level modeling for Agroelectronics, Bio/Med, IoT applications
- Device cryogenic operation for Quantum Computing
- Nanoscale semiconductor devices/circuits and its reliability/ageing
- Technology R&D, DFY, DFT and IC Designs
- Foundry/Fabless Interface Strategies, Open Access PDK(eg: Skywater 130nm CMOS, IHP 130nm RF BiCMOS)
- 2nd Announcement: Oct. 20213
- Final Workshop Program: Nov.28 2023
- MOS-AK Workshop: Dec.13, 2023
in timeframe of IEDM and Q4 CMC Meetings
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[Call for Book Chapters] Perovskite Solar Cells
- Introduction to Perovskite Solar Cells
- Fundamentals of Perovskite Materials
- Fabrication Techniques
- Characterization Methods
- Perovskite Solar Cell Physics
Chapter proposal submission deadline: 15th November 2023
Notification of Acceptance: 21st November 2023
Full Chapter submission: 30th January 2024
Acceptance/Rejection Notification: 10th February 2024
Prospective authors are requested to submit their chapter proposals/full chapters.
[webinar] IEEE SCV-EDS: Investigating quantum speed limits with superconducting qubits
When: Friday, Oct. 20, 2023 – 9am to 10am (PDT)
Where: This is an online event and attendees can participate via Zoom.
Registration or Send an email to hiuyung.wong at ieee.org to get the zoom link indicating if you are IEEE member, IEEE EDS member, IEEE Student member
Oct 16, 2023
[IHP Career] Research associate for Open PDK Development
The position:
Oct 13, 2023
[conference] FIRST 2023
Registration(注册网址): 中文站 - https://www.aconf.cn/conf_194081.html
Oct 9, 2023
[C4P] IJNM - 7th Sino MOS-AK Workshop
http://www.mos-ak.org/nanjing_2023/.
With the aggressive scaling of CMOS technologies and constantly emerging diversified devices, accurate device modeling technique poses severe challenge to circuit and system designers, in particular for RF/MW/mmW/THz/Power/optics. With this background, the workshop aims to strengthen a network and discussion forum among experts in the field, provide a forum for the presentation and discussion of the leading-edge research and development results of Analytical Modeling, Compact Modeling, Characterization and Simulation techniques for advanced devices, circuits and technologies. Modeling and validation technique of all solid-state devices, including, Si, III-V, power, nanoscale electronic structures and other related new devices are within the scope of the conference. The theme of MOS-AK is "Bridge of Process Technology and Integrated Circuits & Systems Design".
Topics for this call for papers include but not restricted to:
- Advances in semiconductor technologies and processing (CMOS, SOI, FINFET, III-V, Wide band-gap)
- CM of passive active, sensors, and actuators
- Emerging Devices, photonic devices, CMOS, and SOI-based memory cell
- RF/THz device and Power device modeling
- Power device and Power integration
- Reliability modeling
- AI and machine learning in EDA & modeling application
- Nanoscale CMOS devices and circuits
- Verilog-A language for CM standardization
- New CM techniques and extraction software
- Open-source TCAD/EDA modeling and simulation
- Technology R&D, DFY, DFT and IC Designs
- Chiplet Modeling and Packaging-related modeling
- Foundry/Fabless Interface Strategies, Open Access PDKs
- DTCO & STCO-related EDA tools/technologies
- Other related topics
Guest Editors:
-
Jun Zhang
Nanjing University of Posts and Telecommunications (CN) -
Yuehang Xu
University of Electronic Science and Technology of China (CN) -
Wladek Grabinski
MOS-AK (EU)
Submission Guidelines/Instructions
Authors of papers presented at the conference will be invited to submit an extended paper by 31 December 2023 to a special issue of IJNM. Manuscripts for this special issue should adhere to the requirements for regular papers in IJNM as specified in the journal’s Author Guidelines. The manuscripts will be submitted via the IJNM manuscript submission site, https://wiley.atyponrex.com/journal/jnm. Authors must choose the special issue title from the dropdown list on the “Additional Information” tab.
Oct 6, 2023
[book chapters] Equation-Based Compact Modeling
Chapter: Differential Equation-Based Compact 2-D Modeling of Asymmetric Gate Oxide Heterojunction Tunnel FET; By: Sudipta Ghosh, Arghyadeep Sarkar
Abstract: Tunnel Field Effect Transistor (TFET) has emerged as an effective alternative device to replace MOSFET for a few decades. The major drawbacks of MOSFET devices are the short-channel effects, due to which the leakage current increases with a decrease in device dimension. So, scaling down TFET is more efficacious than that of MOSFETs. Sub-threshold swing (SS) is another advantageous characteristic of TFET devices for high-speed digital applications. In TFETs the SS could be well below 60 mV/decade, which is the thermal limit for MOSFET devices and therefore makes it more suitable than MOSFET for faster switching applications. It is observed from the literature studies that the performances of the TFET devices have been explored thoroughly by using 2-D TCAD simulation but an analytical model is always essential to understand the physical behavior of the device and the physics behind this; which facilitates further, the analysis of the device performances at circuit level as and when implemented.Chapter: Differential Equation-Based Analytical Modeling of the Characteristics Parameters of the Junctionless MOSFET-Based Label-Free Biosensors; by: Manash Chanda, Papiya Debnath, Avtar Singh
Abstract: Recently Field Effect transistor (FET)-based biosensing applications have gained significant attention due to the demand for quick and accurate diagnosis of different enzymes, proteins, DNA, viruses, etc; cost-effective fabrication process; portability and better sensitivity and selectivity compared to the existing biosensors. FET is basically a three-terminal device with source, drain, and gate terminals. Basically, the gate terminal controls the current flow between the source and drain terminals. In FETs, first, a nanogap is created in the oxide layer or in the gate by etching adequate materials. When the biomolecules are trapped inside the nanocavity then the surface potentials change and also the threshold voltage varies. As a result, the output current also changes. Finally, by measuring the changes in the threshold voltage or the device current, one can easily detect the biomolecules easily.
Oct 4, 2023
[open positions] TU Warsaw
Links to offers with a list of documents to apply:
- (PostDoc): https://lnkd.in/di7dwV5p
- (Assistant Professor): https://lnkd.in/dk5d6Dfa
[Short Course] MACHINE LEARNING FOR ELECTRON DEVICES
KEY HIGHLIGHTS
- Lectures from basic machine learning to advanced ideas
- Hands-on tutorials for developing your own Machine learning models
- Excellent networking opportunity
- Interaction with experts from industry and academia
- UG Fellowships up to ₹ 10000/month for selected participants
- Funding opportunity upto INR 40Lacs as start-up seed grant for selected ideas
Oct 3, 2023
[paper] GaN-on-Si HEMT
a Center for Nanoscience and Engineering (CeNSE), (IISc Bangalore (IN)
b Department of Electrical Engineering, IISc Bangalore (IN)
[paper] Knowing Your Heart Condition Anytime
Oct 2, 2023
[C4P] LASCAS 2024
● Analog and Digital Signal Processing● Biomedical Circuits and Systems● Intelligent Sensor Systems and Internet of Things● Artificial Intelligence and Smart Systems● Nanoelectronics and Gigascale Systems● Electronic Design Automation● Circuits and Systems for Communications● RF Circuits and Systems● Smart Systems and Smart Manufacturing● Power Systems and Power Electronic Circuits● Multimedia Systems and Applications● Life Science Systems and Applications● Electronic Testing● Fault Tolerant Circuits● Nonlinear Circuits and Systems● Cognitive Computing and Deep Learning● Computing and Big Data Applications
Dr. Matías Miguez – UCU, Uruguay.Dr. Pablo Pérez-Nicoli – Udelar, Uruguay.
Dr. Maysam Ghovanloo –Silicon Creations, USADr. José Lipovetzky – IB-CNA, Argentina