The 2007 International Microwave Symposium is a little over a month away. It will be held in Honolulu, Hawaii, between 3-8 June. And, as predicted, they are hosting some sessions on modeling. In fact, as reflected in the technical program, they will host two short courses on device modeling and characterization, plus another in noise. In addition, there will be four different sessions dedicated to models. A nice opportunity to visit Hawaii...
Apr 27, 2007
International Microwave Symposium'07
Apr 25, 2007
Biosensors and CNTs
A brief comment on a brief news appeared in the SPIE newsroom: Joe Shapter and Jamie Quinton, from the Finders University, Australia, explain how to ease the integration of biosensors into silicon, thanks to the use of carbon nanotubes. It's ok, but we still do not have any compact model for a carbon nanotube, so simulation of this kind of sensors is not feasible in a conventional simulator. It's a pity.
Apr 23, 2007
MOS-AK Meeting in Graz
The Spring MOS-AK meeting was held on April 30 in Premstraetten (very close to Graz), Austria
The scope of Spring Meeting was noise compact modeling, but also included contributions on noise measurement and characterization. Different devices were considered: conventional bulk MOSFETs, lateral MOSFETs, multiple-gate MOSFETs.
It was a very interesting meeting, with the participation of top researchers in the field of noise and compact modeling, such as Christoph Jungemann or Mitiko Miura-Mattausch (who explained the implementation of noise modelling in the HiSIM bulk MOSFET model).
Furthermore, it was a very nice oportunity to visit the beautiful city of Graz, and to taste the delicious pumkin-based Styrian specialties as well as the great local wines.
The scope of Spring Meeting was noise compact modeling, but also included contributions on noise measurement and characterization. Different devices were considered: conventional bulk MOSFETs, lateral MOSFETs, multiple-gate MOSFETs.
It was a very interesting meeting, with the participation of top researchers in the field of noise and compact modeling, such as Christoph Jungemann or Mitiko Miura-Mattausch (who explained the implementation of noise modelling in the HiSIM bulk MOSFET model).
Furthermore, it was a very nice oportunity to visit the beautiful city of Graz, and to taste the delicious pumkin-based Styrian specialties as well as the great local wines.
New issue of the IEEE Trans. on Electron Devices
Some new papers from quite important people in this month's issue of the IEEE Trans. on Electron Devices:
First, A Compact Model for Valence-Band Electron Tunneling Current in Partially Depleted SOI MOSFETs From Gildenblat, McAndrew,... etc...
Second, Depletion-All-Around Operation of the SOI Four-Gate Transistor from Cristoloveanu et alter.
First, A Compact Model for Valence-Band Electron Tunneling Current in Partially Depleted SOI MOSFETs From Gildenblat, McAndrew,... etc...
Second, Depletion-All-Around Operation of the SOI Four-Gate Transistor from Cristoloveanu et alter.
Apr 20, 2007
More statistical modelling
Have a look at this paper from Samsudin et al. in the Solid-State Journal. If you are interested in statistical variations (and perhaps you should...), it is a nice reading.
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