#IJNM #paper Ye Yuan Zheng Zhong Yong‐xin Guo Shanxiang Mu A novel large‐signal FET model considering trapping‐induced dispersions https://t.co/UYndQ8cKK1” https://t.co/vu0WQtnRgr https://t.co/BiU9XDDiZc

#IJNM #paper Ye Yuan Zheng Zhong Yong‐xin Guo Shanxiang Mu A novel large‐signal FET model considering trapping‐induced dispersions https://t.co/UYndQ8cKK1” https://t.co/vu0WQtnRgr pic.twitter.com/BiU9XDDiZc

— Wladek Grabinski (@wladek60) January 31, 2019

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January 31, 2019 at 04:30PM
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Multiphysics Simulation of Biosensors

M. Madec, L. Hébrard, J. Kammerer, A. Bonament, E. Rosati and C. Lallement

Multiphysics Simulation of Biosensors Involving 3D Biological Reaction-Diffusion Phenomena in a Standard Circuit EDA Environmen

IEEE Transactions on Circuits and Systems I: Regular Papers.

doi: 10.1109/TCSI.2018.2885223

Abstract: The topic of this paper is the development of biological models for 3D reaction-diffusion phenomena that can be used in any circuit electronic design automation environment for the simulation of biosensors. Biological systems that involve such 3D phenomena are described by partial differential equations. Our approach consists in discretizing these equations according to the finite-difference method and converting the resulting ordinary differential equations into an assembly of elementary electronic equivalent circuits that are directly simulated with SPICE. The main interest of this approach is the ability to couple such models with third-party SPICE models of electronic circuits, sensors, and transducers, i.e., models from any physical domain ruled by Kirchhoff laws, allowing modeling and simulation of any multi-physics systems in a conventional circuit design environment, here CADENCE. The tool is validated on simple problems for which analytical solutions are known. Then, the interest of the approach is illustrated on the study of a biosensor.

URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8602461&isnumber=4358591

E.A. Vittoz “CRYSTAL (and MEMS) OSCILLATORS" (course) November 2018 DOI: 10.13140/RG.2.2.25856.07689 https://t.co/NBz9JnZNSL #paper https://t.co/3A1AvRYHd9

E.A. Vittoz “CRYSTAL (and MEMS) OSCILLATORS" (course)
November 2018
DOI: 10.13140/RG.2.2.25856.07689https://t.co/NBz9JnZNSL#paper pic.twitter.com/3A1AvRYHd9

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#C4P for a Special Issue of IEEE #TED on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices https://t.co/0Tcarn2xGC #paper

#C4P for a Special Issue of IEEE #TED on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices https://t.co/0Tcarn2xGC #paper

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A #SPICE Compatible Compact #Model for #Hot-Carrier Degradation in MOSFETs Under Different Experimental Conditions - IEEE Journals & Magazine https://t.co/W7w1zqzXnn

A #SPICE Compatible Compact #Model for #Hot-Carrier Degradation in MOSFETs Under Different Experimental Conditions - IEEE Journals & Magazine https://t.co/W7w1zqzXnn

— Wladek Grabinski (@wladek60) January 19, 2019

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