#C4P for a Special Issue of IEEE #TED on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices https://t.co/0Tcarn2xGC #paper
— Wladek Grabinski (@wladek60) January 21, 2019
from Twitter https://twitter.com/wladek60
January 21, 2019 at 05:58PM
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Submission deadline: March 31, 2019 Publication date: October 2019
Guest Editors:
1. Dr. Andreas Kerber, Globalfoundries, USA
2. Dr. Chandra Mouli, Micron Technology Inc., USA
3. Prof. Durga Misra, New Jersey Institute of Technology, USA
4. Prof. Gaudenzio Meneghesso, University of Padova, USA
5. Dr. James Stathis, IBM, USA
6. Prof. Ninoslav D. Stojadinovié, University of Nis, SERBIA
7. Dr. Randy Koval, Intel
8. Prof. Souvik Mahapatra, IIT, Bombay, INDIA
9. Dr. Stephen Ramey, Intel, USA
10. Prof. Tibor Grasser, TU, Wien, AUSTRIA.
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