A physics-based compact model for MoS2 field-effect transistors
considering the band-tail effect and contact resistance
Yuan Liu1, Jiawei Zeng2, Zeqi Zhu1, Xiao Dong2 and WanLing Deng3
Japan Society of Applied Physics; Accepted Manuscript online 11 September 2020
1Guangdong University of Technology, Guangzhou, Guangdong, CHINA
2Jinan University, Guangzhou, Guangdong, CHINA3Electronic Engineering, Jinan University, Guangzhou, GuangDong, 510630, CHINA
Abstract: In this paper, we present a compact surface-potential-based drain current model in molybdenum disulfide (MoS2) field-effect transistors (FETs). Considering variable range hopping (VRH) transport via band-tail states in MoS2 transistors, an explicit solution for surface potential has been derived and it provides a good description over different regions of operation by comparisons with numerical data. Based on charge-sheet model (CSM) which applies to drift-diffusion transport, the current expression including contact resistance and velocity saturation effect is developed. Furthermore, the presented model is validated and shows a good agreement with experiment data for MoS2 FETs. Keywords: molybdenum disulfide (MoS2), surface potential, current expression.