VIRTUAL MINI-COLLOQUIUM ON COMPACT MODELING
IEEE EDS Compact Modeling Technical Committee
EDS Spain Chapter
Department of Electronic, Electrical and Automatic Control Engineering,
University Rovira I Virgili, Tarragona (Spain)
December 17, 2020 EDS MQ Program (times in CET) |
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10:20-10:30 Benjamin IƱiguez, IEEE EDS MQ Chair Department of Electronic, Electrical and Automatic Control Engineering, University Rovira I Virgili, Tarragona (Spain) Opening session |
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10:30-11:15 Yogesh. S Chauhan Department of Electrical Engineering, Indian Institute of Technology Kanpur (India) “BSIM-BULK and BSIM-HV: Industry Standard SPICE Models for Analog, RFand High Voltage Applications” |
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11:15-12:00 Manoj Saxena Department of Electronics, University of Delhi (India) “Modeling and Simulation of Robust Ultrasensitive Tunnel Field Effect Transistor Design for Biosensing Applications” |
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12·00-12:45 Wladek Grabinski GMC, Commugny (Switzerland) “FOSS TCAD/EDA Tools for Semiconductor Device Modeling” |
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12:45-13:30 Arokia Nathan Darwin College, University of Cambridge (UK) “Physics-Based Parameter Extraction for TFTs” |
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13:30-15:00 Break |
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15:00-15:45 Marcelo Pavanello Department of Electrical Engineering, Centro Universitario FEI, Sao Bernardo do Campo (Brazil) "Quantum Effects on the Mobility of SOI Nanowire MOSFETs Induced by the Active Substrate Bias" |
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15:45-16:30 Michael S. Shur Department of Electrical, Systems and Computer Engineering, Rensselaer Polytechnic Institute, Troy NY (USA) “THz Compact SPICE/ADS model” |
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16:30-17:15 Edmundo GutiĆ©rrez Department of Electronics, INAOE, Puebla (Mexico) "RF MOSFET degradation modeling up to 67 GHz” |
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End of EDS MQ |
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