8th International MOS-AK Workshop
Washington DC December 9, 2015
The Final MOS-AK Workshop Program
Washington DC December 9, 2015
The Final MOS-AK Workshop Program
Together with the MOS-AK Workshop Scientific Program Coordinators Larry Nagel and Andrei Vladimirescu, as well as Extended MOS-AK TPC Committee, we have pleasure to invite to the MOS-AK Workshop which will be held in Washington DC in the IEDM / CMC meetings timeframe on December 9, 2015. The MOS-AK workshop is organized with aims to strengthen an academic/industry network and discussion forum among experts in the field, enhance open platform for information exchange related to compact/SPICE modeling and Verilog-A standardization, bring people in the compact modeling field together, as well as obtain feedback from technology developers, circuit designers, and CAD/EDA tool developers and vendors.
Venue:
Embassy of Switzerland
2900 Cathedral Ave, NW,
Washington, DC 20008
USA
2900 Cathedral Ave, NW,
Washington, DC 20008
USA
Free Online Workshop Registration:
http://www.mos-ak.org/washington_dc_2015/registration.php
(any related inquiries can be sent to register@mos-ak.org)
(any related inquiries can be sent to register@mos-ak.org)
Workshop Agenda:
- MOS-AK Workshop - Dec, 9, 2015
- Online Technical Program http://www.mos-ak.org/
washington_dc_2015/ - 08:30 - 09:00 - On-site Registration
- 09:00 - 12:30 - Morning MOS-AK Session
- TCAD and Advanced CMOS Technologies
- Compact Modeling and Reliability Co-simulation
- 12:30 - 13:30 - Lunch
- 13:30 - 17:00 - Afternoon MOS-AK Session
- CMC Compact Model Standardization
- FOSS Tools for Compact Model Verilog-A Standardization
- 17:00 End of the workshop
Postworkshop Publications:
Selected best MOS-AK technical presentation will be recommended for further publication in a special compact modeling issue of the International Journal of High Speed Electronics and Systems (IJHSES)
Extended MOS-AK Committee
Selected best MOS-AK technical presentation will be recommended for further publication in a special compact modeling issue of the International Journal of High Speed Electronics and Systems (IJHSES)
Extended MOS-AK Committee
WG/18/11/15
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