Oct 2, 2023

[C4P] LASCAS 2024

 

LASCAS 2024
An IEEE CASS Flagship Conference
15th IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS
February 27 - March 01, 2024
ieee-lascas.org
PUNTA DEL ESTE - URUGUAY

Since its first edition in 2010, LASCAS provides a high-quality exchange and networking forum for researchers, professionals, and students, gathering an international audience with experts from all over the world. This event is a space where the CAS community can present new concepts and innovative approaches, learn about new trends and solutions, and receive feedback from specialists in diverse fields.

The 15th edition will take place in Punta del Este, Uruguay. With its lush landscapes, pristine beaches, and sophisticated amenities, it has established itself as a premier tourist destination in South America. It offers an unparalleled experience, where visitors can immerse themselves in a rich blend of natural beauty and modern luxury. The city is easily accessible by air, with regular flights from major cities in South America, and just 90 minute from Montevideo and its international airport. Punta del Este is ready to receive you. The symposium will cover technical novelties and tutorial overviews on circuits and systems topics including but not limited to:
● Analog and Digital Signal Processing
● Biomedical Circuits and Systems
● Intelligent Sensor Systems and Internet of Things
● Artificial Intelligence and Smart Systems
● Nanoelectronics and Gigascale Systems
● Electronic Design Automation
● Circuits and Systems for Communications
● RF Circuits and Systems
● Smart Systems and Smart Manufacturing
● Power Systems and Power Electronic Circuits
● Multimedia Systems and Applications
● Life Science Systems and Applications
● Electronic Testing
● Fault Tolerant Circuits
● Nonlinear Circuits and Systems
● Cognitive Computing and Deep Learning
● Computing and Big Data Applications

Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements. Best papers will be invited to a special edition of the IEEE Transactions on Circuits and Systems I (TCAS-I) and IEEE Transactions on Circuits and Systems II (TCAS-II). A social program will be offered, including special events and tours to selected attractions for the attendees and their guests.

General Chairs:
Dr. Matías Miguez – UCU, Uruguay. 
Dr. Pablo Pérez-Nicoli – Udelar, Uruguay. 
Program Chairs:
Dr. Maysam Ghovanloo –Silicon Creations, USA
Dr. José Lipovetzky – IB-CNA, Argentina

Sep 29, 2023

[workshop] QC:DCEP 2023

Workshop on
Quantum Computing: Devices, Cryogenic Electronics and Packaging
A Seasonal School of the IEEE Circuits & Systems Society
Tues/Wed, 24-25 October, 2023 at SEMI World Hdqtrs, Milpitas, CA USA

Welcome to the first year of this new Workshop from the IEEE Circuits and Systems Society, organized and run by three Silicon Valley IEEE chapters: Circuits and Systems, Electron Devices and Electronics Packaging.

The intent of this workshop is to bring together engineers of electrical, mechanical, materials and computer science disciplines and physicists to describe the state-of-the-art in all the interconnected fields and the opportunities and challenges for future generations of quantum computers.
Confirmed plenary and invited talks:

Technical Challenges facing Quantum Computing with Superconducting Transmon Qubits
Dr. Daniel Tennant, Rigetting Computing
Superconducting Multi-Chip Module (SMCM)
Rabindra N. Das, MIT Lincoln Laboratory
 
Introduction to Quantinuum and TKET
Dr. Kathrin Spendier, Quantinuum
Understanding and Addressing Challenges in Superconducting Qubit Scale
Jennifer Smith, UC-Santa Barbara
 
Integrated Quantum-Classical Applications with CUDA Quantum
Dr. Jin-Sung Kim, NVIDIA
A 22nm FD-SOI-CMOS Scalable Quantum Processor SoC with Fully Integrated Control Electronics at 3.5K
Dr. Imran Bashir, Equal1
 
Network Architecture for a Scalable Spin Qubit Processor
Prof. Jonathan Baugh, Univ. of Waterloo
Quantum Computing with Silicon Spins
Dr. Dominik Zumbuhl, Univ of Basel
 
Quantum Error Correction in Bosonic Qubits
Marina Kudra, PhD, Intermodulation Products
Thermal Management Challenges in Cryogenic System Integration: Spin Qubit Biasing with a CMOS DAC at mK Temperature
Lea Schreckenberg, Forschungszentrum Jülich GmbH
 



plus additional technical talks 

Drawings will be held for two GeForce RTX-4090 graphics cards, donated by NVIDIA — one will be awarded to an on-site speaker, while the other will be awarded to an on-site attendee. These new gaming accelerators for Windows PCs are not yet on sale. Need not be present to win. We invite you to register for QC:DCEP 2023 using our EventBrite site. Register today!

Sep 28, 2023

[C4P] 36th ICMTS 2024

36th International Conference on Microelectronic Test Structures
April 15-18, 2024, Edinburgh, Scotland

Looking for the best opportunity to present and discuss your ideas and results about test structures, measurements and characterization? This is your chance! Join the 36th ICMTS conference. A Tutorial Short Course will precede the main conference. Several of the best measurement, equipment design, and manufacturing experts, will participate in the equipment exhibition and presentations. The conference will bring together designers and users of test structures to discuss recent developments and future directions, in a one-track program, with convivial breaks allowing attendees to discuss and exchange viewpoints and challenges.

A Best Paper award will be presented by the Technical Program Committee. The conference is co-sponsored by the IEEE Electron Devices Society and all accepted papers, if presented, will be submitted for possible inclusion on IEEEXplore®. Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures, measurements, and results, in the following areas:
  • Design
    • Methodologies, Verification
    • Within-die circuits for process characterization/monitoring
    • Design enablement – Characterization and validation of digital and analog libraries
    • Devices and Circuit Modelling
  • Measurement techniques
    • DC, AC and RF measurements: setup, test and analysis
    • Reliability test - including thermal stability, failure analysis etc.
    • Statistical analysis, variability, throughput increase, smart test strategies
    • Use of machine learning and AI in analysis of data sets - parameter extraction etc.
    • Wafer probing, within-die measurements, in-line metrology
    • Throughput, testing strategies, yield enhancement and process control tests
  • Applications
    • Emerging memory technologies (single cell, arrays, and application in neural networks)
    • Emerging transistor technologies for digital/analog/power applications
    • Photonic devices - silicon integration, new displays (OLED, μ-displays)
    • Flexible electronics and sensors (organic and inorganic materials)
    • M(N)EMS, actuators, sensors, PV cells and other emerging devices
The author’s abstract submission consists of up to four pages in PDF format (font-embedded). The first page should include a title, a 50-word summary, author name(s), full address, contact number and e-mail of the lead author, and any preference for oral or poster session presentation. The body of the abstract should consist of one page of text (800 to 1000 words) and up to two pages of major figures and tables. The selection process will be based on the technical merit and will be highly weighted in favour of abstracts with high test structure content, giving a clear illustration of the test structure and including measurements and data analysis.

The abstract submission deadline is October 27th, 2023.

Abstracts can be submitted via the ICMTS 2024 website www.icmts.net using the “Abstract Submission” link on the front page. Notice of paper acceptance will be sent to the selected authors by 12th January 2024, with instructions for the expanded manuscript preparation for the conference proceedings. The deadline for submission of the final paper will be Early March, 2024 (TBC).

Please join the ICMTS LI group, if you have interest in all things test and measurement.

Details of the venue, hotel, registration, etc. will be posted when available at the ICMTS 2024 official website.

For further technical information, please contact the technical program chair:
Francesco Driussi, Università di Udine

3rd MFEM Community Workshop, October 26, 2023

MFEM is a free, open source, lightweight, scalable C++ library for finite element methods.

Features
MFEM is used in many projects, including BLAST, Cardioid, Palace, VisIt, RF-SciDAC, FASTMath, xSDK, and CEED in the Exascale Computing Project.

Annual workshop 
MFEM host an annual workshop and FEM@LLNL seminar series. The MFEM team has  announced the 3rd MFEM Community Workshop, which will take place on October 26, 2023, virtually, using Zoom for videoconferencing. The goal of the workshop is to foster collaboration among all MFEM users and developers, share the latest MFEM features with the broader community, deepen application engagements, and solicit feedback to guide future development directions for the project.

Registration
If you plan to attend, please register no later than October 19th. There is no registration fee. Zoom details will be distributed to participants prior to the event date. For questions, please contact the meeting organizers at mfem@llnl.gov.





Sep 27, 2023

[paper] Model for Cryo-CMOS Subthreshold Swing

Arnout Beckers, Jakob Michl, Alexander Grill, Member IEEE; Ben Kaczer, Marie Garcia Bardon, Bertrand Parvais, Bogdan Govoreanu, Kristiaan De Greve, Gaspard Hiblot, 
and Geert Hellings, Senior Member IEEE
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
in IEEE Transactions on Nanotechnology, vol. 22, pp. 590-596, 2023,
DOI 10.1109/TNANO.2023.3314811.

IMEC, Leuven (B)
Institute for Microelectronics, TU Vienna (A)
Vrije Universiteit Brussel (B)
KU Leuven (B)

Abstract: Cryogenic semiconductor device models are essential in designing control systems for quantum devices and in benchmarking the benefits of cryogenic cooling for high-performance computing. In particular, the saturation of subthreshold swing due to band tails is an important phenomenon to include in low-temperature analytical MOSFET models, as it predicts theoretical lower bounds on the leakage power and supply voltage in tailored cryogenic CMOS technologies with tuned threshold voltages. Previous physics-based modeling required to evaluate functions with no closed-form solutions, defeating the purpose of fast and efficient model evaluation. Thus far, only the empirically proposed expressions are in closed form. This article bridges this gap by deriving a physics-based and closed-form model for the full saturating trend of the subthreshold swing from room down to low temperature. The proposed model is compared against experimental data taken on some long and short devices from a commercial 28-nm bulk CMOS technology down to 4.2 K.

FIG: (a) TEM picture of a mature imec technology node. (b) Electrostatic potential fluctuations near the channel/oxide interface. (c) Gaussian distributed depths of the potential wells. (d) Including the binding energy in the wells in the quantum picture gives a Laplace distribution of P(Eb). (e-f) Convolution (*) of P(Eb) with the sharp-edged 2-D DOS leads to a logistic/Fermi-like DOS function with an exponential tail.