#paper: Z. Wu et al., "A physics-aware compact modeling framework for transistor aging in the entire bias space," 2019 IEEE IEDM, San Francisco, CA, USA, 2019, pp. 21.2.1-21.2.4. https://t.co/sF6okiUdAk https://t.co/bxo7NNAiiV

#paper: 

Z. Wu et al., "A physics-aware compact modeling framework for transistor aging in the entire bias space," 2019 IEEE IEDM, San Francisco, CA, USA, 2019, pp. 21.2.1-21.2.4. https://t.co/sF6okiUdAk

sEKV References:
[8] C Enz et al., SSCM, vol. 9, no. 3, 2017.
[9] A Mangla et al., MIXDES, 2011.

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